Inventor

LIANG ARDIS

US7 patents

⚠️ This page may combine multiple inventors who share the name “LIANG ARDIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

3 patents

US7796804B2Sep 14, 2010

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

KLA TENCOR CORP25 citations91

US10209628B2Feb 19, 2019

System and method for defect classification based on electrical design intent

KLA TENCOR CORP1 citations58

US9835566B2Dec 5, 2017

Adaptive nuisance filter

KLA TENCOR CORP1 citations50

KLA CORP

2 patents

US11055840B2Jul 6, 2021

Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection

KLA CORP2 citations70

US12387310B2Aug 12, 2025

Wafer signature local maxima via clustering for metrology guided inspection

KLA CORP0 citations47

BHASKAR KRIS

1 patent

US8204296B2Jun 19, 2012

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

BHASKAR KRIS15 citations81

KLA TENCOR TECH CORP

1 patent

US7345753B2Mar 18, 2008

Apparatus and methods for analyzing defects on a sample

KLA TENCOR TECH CORP6 citations61