Inventor
COOK III JOHN H
US3 patents
Patents
3 patentsUS6320812B1Nov 20, 2001
Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed
AGILENT TECHNOLOGIES INC51 citations89
US6851076B1Feb 1, 2005
Memory tester has memory sets configurable for use as error catch RAM, Tag RAM's, buffer memories and stimulus log RAM
AGILENT TECHNOLOGIES INC36 citations88
US7076714B2Jul 11, 2006
Memory tester uses arbitrary dynamic mappings to serialize vectors into transmitted sub-vectors and de-serialize received sub-vectors into vectors
AGILENT TECHNOLOGIES INC18 citations80