Inventor

JING TIANWEI

US23 patents

⚠️ This page may combine multiple inventors who share the name “JING TIANWEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JING TIANWEI

MOLECULAR IMAGING CORP

Force sensing probe for scanning probe microscopy

Scanning probe microscope for use in fluids

Scanning probe microscope

Electrochemical identification of molecules in a scanning probe microscope

Magnetically-oscillated probe microscope for operation in liquids

Vibrating tip conducting probe microscope

Conducting scanning probe microscope with environmental control

Heated stage for a scanning probe microscope

Hybrid control system for scanning probe microscopes

Scanning probe microscope

Stress cell for a scanning probe microscope

Magnetic modulation of force sensor for AC detection in an atomic force microscope

Tip coating system for scanning probe microscopy

Microscope for compliance measurement

Tip etching system and method for etching platinum-containing wire

Pendulum scanner for scanning probe microscope

Scanning probe microscope and solenoid driven cantilever assembly

BIOSENSING INSTR INC

Surface plasmon resonance imaging system and method for measuring molecular interactions

Surface plasmon resonance imaging system and method for measuring molecular interactions

MOLECULAR IMAGING CORP ARIZONA

Cantilevers for a magnetically driven atomic force microscope

JING TIANWEI

Apparatus for detecting one or more substances and method of detecting a substance

RANKL CHRISTIAN

Controlling atomic force microscope using optical imaging

AGILENT TECHNOLOGIES INC

Fast scanning stage for a scanning probe microscope