Inventor
OZAWA TETSUYA
JP32 patents
⚠️ This page may combine multiple inventors who share the name “OZAWA TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIGAKU DENKI CO LTD
17 patentsUS6999557B2Feb 14, 2006
Method of setting measuring range of reciprocal-space mapping
RIGAKU DENKI CO LTD13 citations83
US7684543B2Mar 23, 2010
X-ray beam conditioning device and X-ray analysis apparatus
RIGAKU DENKI CO LTD10 citations82
US7120227B2Oct 10, 2006
Method of displaying dynamically scattering vector of X-ray diffraction
RIGAKU DENKI CO LTD13 citations81
US6385281B1May 7, 2002
Fluorescent x-ray analyzing method and apprartus
RIGAKU DENKI CO LTD10 citations73
US10854348B2Dec 1, 2020
X-ray generator and x-ray analysis device
RIGAKU DENKI CO LTD2 citations72
US10436723B2Oct 8, 2019
X-ray diffractometer with multilayer reflection-type monochromator
RIGAKU DENKI CO LTD2 citations72
US9618461B2Apr 11, 2017
X-ray analysis apparatus
RIGAKU DENKI CO LTD5 citations69
US11942231B2Mar 26, 2024
Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus
RIGAKU DENKI CO LTD1 citations62
US12287301B2Apr 29, 2025
Correction amount specifying apparatus, method, program, and jig
RIGAKU DENKI CO LTD0 citations61
US7860217B2Dec 28, 2010
X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
RIGAKU DENKI CO LTD6 citations60
US7337098B2Feb 26, 2008
Diffraction condition simulation device, diffraction measurement system, and crystal analysis system
RIGAKU DENKI CO LTD4 citations60
US11215571B2Jan 4, 2022
X-ray analysis apparatus
RIGAKU DENKI CO LTD0 citations57
US12174131B2Dec 24, 2024
Quantitative analysis apparatus, method and program and manufacturing control system
RIGAKU DENKI CO LTD1 citations53
US12175173B2Dec 24, 2024
Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program
RIGAKU DENKI CO LTD0 citations51
US12405390B2Sep 2, 2025
Control apparatus, system, method, and program
RIGAKU DENKI CO LTD0 citations50
US10900913B2Jan 26, 2021
X-ray diffraction apparatus
RIGAKU DENKI CO LTD0 citations50
US9490038B2Nov 8, 2016
X-ray optical component device and X-ray analyzer
RIGAKU DENKI CO LTD1 citations48
HONDA MOTOR CO LTD
4 patentsUS5945011AAug 31, 1999
Control apparatus for welding robot and method of teaching welding robot
HONDA MOTOR CO LTD39 citations92
US8024067B2Sep 20, 2011
Working station
HONDA MOTOR CO LTD4 citations54
US12454149B2Oct 28, 2025
Wheel and manufacturing method of wheel
HONDA MOTOR CO LTD0 citations53
US10556297B2Feb 11, 2020
Welded section examining device
HONDA MOTOR CO LTD0 citations33
OZAWA TETSUYA
3 patentsUS9336917B2May 10, 2016
X-ray apparatus, method of using the same and X-ray irradiation method
OZAWA TETSUYA12 citations82
US9074992B2Jul 7, 2015
X-ray diffraction apparatus and X-ray diffraction measurement method
OZAWA TETSUYA3 citations60
US8991641B2Mar 31, 2015
Pressure vessel and method of manufacturing the same
OZAWA TETSUYA2 citations60
CALSONIC KANSEI CORP
3 patentsUS7266433B2Sep 4, 2007
Data recording apparatus for vehicle
CALSONIC KANSEI CORP6 citations63
US7896392B2Mar 1, 2011
Airbag deployment controller and passenger protection device including the same
CALSONIC KANSEI CORP4 citations54
US7558656B2Jul 7, 2009
Vehicle data recording device
CALSONIC KANSEI CORP0 citations42