Inventor

COWAN GREGORY L

US6 patents

Patents

6 patents

US6546512B1Apr 8, 2003

Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit

MICRON TECHNOLOGY INC19 citations91

US5864565AJan 26, 1999

Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit

MICRON TECHNOLOGY INC25 citations91

US6016561AJan 18, 2000

Output data compression scheme for use in testing IC memories

MICRON TECHNOLOGY INC27 citations90

US5787097AJul 28, 1998

Output data compression scheme for use in testing IC memories

MICRON TECHNOLOGY INC35 citations90

US6665827B2Dec 16, 2003

Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit

MICRON TECHNOLOGY INC4 citations72

US6314538B1Nov 6, 2001

Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit

MICRON TECHNOLOGY INC10 citations72