Inventor

LIAO JIAO-ROU

TW2 patents

Patents

2 patents

US11651981B2May 16, 2023

Method and system for map-free inspection of semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59

US11120539B2Sep 14, 2021

Topological scanning method and system

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59