Inventor
LACROIX LUKE D
US8 patents
⚠️ This page may combine multiple inventors who share the name “LACROIX LUKE D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LACROIX LUKE D
4 patentsUS8653662B2Feb 18, 2014
Structure for monitoring stress induced failures in interlevel dielectric layers of solder bump integrated circuits
LACROIX LUKE D5 citations71
US8759977B2Jun 24, 2014
Elongated via structures
LACROIX LUKE D3 citations60
US8586982B2Nov 19, 2013
Semiconductor test chip device to mimic field thermal mini-cycles to assess reliability
LACROIX LUKE D1 citations50
US9057760B2Jun 16, 2015
Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures
LACROIX LUKE D1 citations48
IBM
3 patentsUS6260163B1Jul 10, 2001
Testing high I/O integrated circuits on a low I/O tester
IBM25 citations89
US8999846B2Apr 7, 2015
Elongated via structures
IBM0 citations51
US9599664B2Mar 21, 2017
Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures
IBM1 citations50