Inventor
HERZINGER CRAIG M
US88 patents
⚠️ This page may combine multiple inventors who share the name “HERZINGER CRAIG M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
J A WOOLLAM CO INC
41 patentsUS7907280B2Mar 15, 2011
Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation
J A WOOLLAM CO INC94 citations98
US7633625B1Dec 15, 2009
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC115 citations98
US7460230B2Dec 2, 2008
Deviation angle self compensating substantially achromatic retarder
J A WOOLLAM CO INC108 citations97
US7450231B2Nov 11, 2008
Deviation angle self compensating substantially achromatic retarder
J A WOOLLAM CO INC105 citations97
US6937341B1Aug 30, 2005
System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation
J A WOOLLAM CO INC96 citations97
US5963325AOct 5, 1999
Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC47 citations96
US5963327AOct 5, 1999
Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems
J A WOOLLAM CO INC69 citations96
US5956145ASep 21, 1999
System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems
J A WOOLLAM CO INC85 citations96
US5757494AMay 26, 1998
System and method for improving data acquisition capability in spectroscopic ellipsometers
J A WOOLLAM CO INC77 citations96
US7158231B1Jan 2, 2007
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC26 citations93
US6822738B1Nov 23, 2004
Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
J A WOOLLAM CO INC34 citations93
US6804004B1Oct 12, 2004
Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry
J A WOOLLAM CO INC21 citations93
US6795184B1Sep 21, 2004
Odd bounce image rotation system in ellipsometer systems
J A WOOLLAM CO INC24 citations93
US6456376B1Sep 24, 2002
Rotating compensator ellipsometer system with spatial filter
J A WOOLLAM CO INC42 citations93
US6353477B1Mar 5, 2002
Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
J A WOOLLAM CO INC39 citations93
US6137618AOct 24, 2000
Compact, high extinction coefficient combination brewster angle and other than brewster angle polarizing system, and method of use
J A WOOLLAM CO INC20 citations93
US6118537ASep 12, 2000
Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC39 citations93
US6100981AAug 8, 2000
Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC38 citations93
US6084674AJul 4, 2000
Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC36 citations93
US6084675AJul 4, 2000
Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC48 citations93
US6034777AMar 7, 2000
Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems
J A WOOLLAM CO INC45 citations93
US5946098AAug 31, 1999
Optical elements for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC41 citations93
US5936734AAug 10, 1999
Analysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systems
J A WOOLLAM CO INC56 citations93
US6982792B1Jan 3, 2006
Spectrophotometer, ellipsometer, polarimeter and the like systems
J A WOOLLAM CO INC49 citations92
US7468794B1Dec 23, 2008
Rotating compensator ellipsometer system with spatial filter equivalent
J A WOOLLAM CO INC12 citations84
US7336361B1Feb 26, 2008
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC15 citations84
US7295313B1Nov 13, 2007
Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters
J A WOOLLAM CO INC12 citations84
US6940595B1Sep 6, 2005
Application of spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters
J A WOOLLAM CO INC14 citations84
US6831740B2Dec 14, 2004
Methodology for improving precision of data acquired by spectrophotometer systems
J A WOOLLAM CO INC13 citations84
US7385697B2Jun 10, 2008
Sample analysis methodology utilizing electromagnetic radiation
J A WOOLLAM CO INC19 citations83
US7280194B1Oct 9, 2007
Accurate determination of refractive indices of solid, fluid and liquid materials
J A WOOLLAM CO INC12 citations83
US7274450B1Sep 25, 2007
Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems
J A WOOLLAM CO INC19 citations83
US7239391B2Jul 3, 2007
Method of analysis of multiple layer samples
J A WOOLLAM CO INC15 citations83
US9851294B1Dec 26, 2017
Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use
J A WOOLLAM CO INC9 citations81
US6549282B1Apr 15, 2003
Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems
J A WOOLLAM CO INC16 citations81
US6441902B1Aug 27, 2002
Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions
J A WOOLLAM CO INC14 citations81
US7304737B1Dec 4, 2007
Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence
J A WOOLLAM CO INC8 citations74
US7245376B2Jul 17, 2007
Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter
J A WOOLLAM CO INC9 citations74
US7193710B1Mar 20, 2007
Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses
J A WOOLLAM CO INC9 citations74
US6483586B1Nov 19, 2002
Beam splitting analyzer means in rotating compensator ellipsometer
J A WOOLLAM CO INC8 citations74
US5835222ANov 10, 1998
System, and mathematical regression-based method utilizing optical data, for identifying optical axis orientation in material systems such as optical compensators and retarders
J A WOOLLAM CO INC13 citations74
HERZINGER CRAIG M
6 patentsUS8736838B2May 27, 2014
Terahertz ellipsometer system, and method of use
HERZINGER CRAIG M13 citations84
US8564777B1Oct 22, 2013
System and method for compensating detector non-idealities
HERZINGER CRAIG M8 citations84
US8705032B2Apr 22, 2014
Terahertz-infrared ellipsometer system, and method of use
HERZINGER CRAIG M7 citations83
US8416408B1Apr 9, 2013
Terahertz-infrared ellipsometer system, and method of use
HERZINGER CRAIG M8 citations83
US8248607B1Aug 21, 2012
Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfaces
HERZINGER CRAIG M8 citations83
US8169611B2May 1, 2012
Terahertz-infrared ellipsometer system, and method of use
HERZINGER CRAIG M10 citations81
JAMES D WELCH
1 patentJ A WOOLLAM CO
1 patentJ A WOOLAM CO INC
1 patentShowing the top 50 of 88 patents by PatentIndex Score.