Inventor
SHIM WOO-GWAN
KR32 patents
⚠️ This page may combine multiple inventors who share the name “SHIM WOO-GWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
25 patentsUS6565736B2May 20, 2003
Wet process for semiconductor device fabrication using anode water containing oxidative substances and cathode water containing reductive substances, and anode water and cathode water used in the wet process
SAMSUNG ELECTRONICS CO LTD42 citations92
US7498217B2Mar 3, 2009
Methods of manufacturing semiconductor memory devices with unit cells having charge trapping layers
SAMSUNG ELECTRONICS CO LTD9 citations84
US7179739B2Feb 20, 2007
Methods of forming a semiconductor device including a metal silicide layer between a conductive plug and a bottom electrode of a capacitor
SAMSUNG ELECTRONICS CO LTD10 citations84
US6701942B2Mar 9, 2004
Method of and apparatus for removing contaminants from surface of a substrate
SAMSUNG ELECTRONICS CO LTD15 citations84
US7018892B2Mar 28, 2006
Semiconductor capacitor structure and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD10 citations74
US11664243B2May 30, 2023
Substrate processing apparatus
SAMSUNG ELECTRONICS CO LTD4 citations73
US7344999B2Mar 18, 2008
Method for cleaning substrate having exposed silicon and silicon germanium layers and related method for fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD7 citations73
US7141123B2Nov 28, 2006
Method of and apparatus for removing contaminants from surface of a substrate
SAMSUNG ELECTRONICS CO LTD7 citations73
US7745338B2Jun 29, 2010
Method of forming fine pitch hardmask patterns and method of forming fine patterns of semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD7 citations71
US7700496B2Apr 20, 2010
Transistor having a metal nitride layer pattern, etchant and methods of forming the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7544985B2Jun 9, 2009
Semiconductor capacitor structure and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7449417B2Nov 11, 2008
Cleaning solution for silicon surface and methods of fabricating semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD4 citations63
US7435644B2Oct 14, 2008
Method of manufacturing capacitor of semiconductor device
SAMSUNG ELECTRONICS CO LTD3 citations63
US7122478B2Oct 17, 2006
Method of manufacturing a semiconductor device using a polysilicon etching mask
SAMSUNG ELECTRONICS CO LTD4 citations63
US7985999B2Jul 26, 2011
Semiconductor device having capacitor
SAMSUNG ELECTRONICS CO LTD2 citations62
US7820508B2Oct 26, 2010
Semiconductor device having capacitor and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US7459370B2Dec 2, 2008
Method of fabricating semiconductor memory device having plurality of storage node electrodes
SAMSUNG ELECTRONICS CO LTD2 citations62
US6844229B2Jan 18, 2005
Method of manufacturing semiconductor device having storage electrode of capacitor
SAMSUNG ELECTRONICS CO LTD3 citations62
US11361960B2Jun 14, 2022
Substrate processing apparatus and substrate processing system including the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US10910237B2Feb 2, 2021
Operating method for wet etching system and related system
SAMSUNG ELECTRONICS CO LTD1 citations61
US7354868B2Apr 8, 2008
Methods of fabricating a semiconductor device using a dilute aqueous solution of an ammonia and peroxide mixture
SAMSUNG ELECTRONICS CO LTD4 citations61
US7879735B2Feb 1, 2011
Cleaning solution for silicon surface and methods of fabricating semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7322385B2Jan 29, 2008
Apparatus for drying substrate and method thereof
SAMSUNG ELECTRONICS CO LTD1 citations52
US10707071B2Jul 7, 2020
Substrate processing apparatus and substrate processing system including the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7825030B2Nov 2, 2010
Method of forming a spacer
SAMSUNG ELECTRONICS CO LTD1 citations51
LEE HYO-SAN
3 patentsUS8790470B2Jul 29, 2014
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN8 citations81
US8585917B2Nov 19, 2013
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN5 citations81
US8084367B2Dec 27, 2011
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN9 citations81