P

Inventor

KAWAMURA DAISUKE

JP89 patents
⚠️ This page may combine multiple inventors who share the name “KAWAMURA DAISUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKAI RIKA CO LTD

18 patents
US7505279B2Mar 17, 2009

Portable device having flexible case

TOKAI RIKA CO LTD22 citations92
US7227447B2Jun 5, 2007

Switch device

TOKAI RIKA CO LTD23 citations92
US9137658B2Sep 15, 2015

Electronic key registration system

TOKAI RIKA CO LTD20 citations84
US9094382B2Jul 28, 2015

Electronic key registration system

TOKAI RIKA CO LTD11 citations84
US9070279B2Jun 30, 2015

Electronic key registration system

TOKAI RIKA CO LTD11 citations84
US7466216B2Dec 16, 2008

Security control system

TOKAI RIKA CO LTD14 citations83
US7199710B2Apr 3, 2007

Controller for remote control system

TOKAI RIKA CO LTD12 citations83
US9714004B2Jul 25, 2017

Electronic key registration system

TOKAI RIKA CO LTD8 citations81
US9509496B2Nov 29, 2016

Electronic key registration system

TOKAI RIKA CO LTD17 citations81
US9020147B2Apr 28, 2015

Electronic key registration method, electronic key registration system, and controller

TOKAI RIKA CO LTD7 citations81
US9509499B2Nov 29, 2016

Electronic key registration method and electronic key registration system

TOKAI RIKA CO LTD6 citations73
US9397829B2Jul 19, 2016

Electronic key registration method and electronic key registration system

TOKAI RIKA CO LTD6 citations73
US9143320B2Sep 22, 2015

Electronic key registration system

TOKAI RIKA CO LTD6 citations73
US9020441B2Apr 28, 2015

Signal transfer time measurement apparatus

TOKAI RIKA CO LTD4 citations73
US9489789B2Nov 8, 2016

Electronic key registration method and electronic key registration system

TOKAI RIKA CO LTD3 citations72
US9330510B2May 3, 2016

Electronic key registration method and electronic key registration system

TOKAI RIKA CO LTD4 citations72
US7432796B2Oct 7, 2008

Security control system for managing registration of ID codes for portable devices

TOKAI RIKA CO LTD8 citations72
US9306735B2Apr 5, 2016

Electronic key registration system

TOKAI RIKA CO LTD6 citations70

TOSHIBA KK

16 patents
US6558853B1May 6, 2003

Method for manufacturing exposure mask, exposure apparatus and semiconductor device

TOSHIBA KK27 citations93
US6881058B2Apr 19, 2005

Apparatus for processing substrate and method of processing the same

TOSHIBA KK14 citations92
US7685556B2Mar 23, 2010

Mask data correction method, photomask manufacturing method, computer program, optical image prediction method, resist pattern shape prediction method, and semiconductor device manufacturing method

TOSHIBA KK10 citations84
US7638001B2Dec 29, 2009

Film forming apparatus, manufacturing management system and method of manufacturing semiconductor devices

TOSHIBA KK14 citations84
US7630053B2Dec 8, 2009

Method of manufacturing semiconductor device and liquid immersion lithography system

TOSHIBA KK13 citations84
US7026099B2Apr 11, 2006

Pattern forming method and method for manufacturing semiconductor device

TOSHIBA KK12 citations84
US7336341B2Feb 26, 2008

Simulator of lithography tool for correcting focus error and critical dimension, simulation method for correcting focus error and critical dimension, and computer medium for storing computer program for simulator

TOSHIBA KK8 citations74
US6627356B2Sep 30, 2003

Photomask used in manufacturing of semiconductor device, photomask blank, and method of applying light exposure to semiconductor wafer by using said photomask

TOSHIBA KK8 citations74
US7742150B2Jun 22, 2010

Manufacturing method of semiconductor device

TOSHIBA KK4 citations63
US7687227B2Mar 30, 2010

Resist pattern forming method and manufacturing method of semiconductor device

TOSHIBA KK3 citations63
US7662546B2Feb 16, 2010

Apparatus for processing substrate and method of processing the same

TOSHIBA KK2 citations63
US7662543B2Feb 16, 2010

Pattern forming method and method of manufacturing semiconductor device

TOSHIBA KK5 citations63
US7005249B2Feb 28, 2006

Apparatus for processing substrate and method of processing the same

TOSHIBA KK2 citations63
US6841404B2Jan 11, 2005

Method for determining optical constant of antireflective layer, and method for forming resist pattern

TOSHIBA KK5 citations63
US7459264B2Dec 2, 2008

Device manufacturing method

TOSHIBA KK5 citations62
US7075098B2Jul 11, 2006

Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus

TOSHIBA KK3 citations62

SONY INTERACTIVE ENTERTAINMENT INC

4 patents

KAWAMURA DAISUKE

4 patents

Sony Interactive Entertainment LLC

3 patents

KURATA TOHRU

1 patent

NEWTON-DUNN HENRY

1 patent

MOCHIDA PHARM CO LTD

1 patent

SONY CORP

1 patent

KOBAYASHI KATSUTOSHI

1 patent

Showing the top 50 of 89 patents by PatentIndex Score.