P

Inventor

TERASHIMA TOMOHIDE

JP87 patents
⚠️ This page may combine multiple inventors who share the name “TERASHIMA TOMOHIDE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

48 patents
US6586780B1Jul 1, 2003

Semiconductor device for supplying output voltage according to high power supply voltage

MITSUBISHI ELECTRIC CORP35 citations93
US6515349B2Feb 4, 2003

Semiconductor device and process for the same

MITSUBISHI ELECTRIC CORP24 citations93
US5894156AApr 13, 1999

Semiconductor device having a high breakdown voltage isolation region

MITSUBISHI ELECTRIC CORP46 citations93
US5889310AMar 30, 1999

Semiconductor device with high breakdown voltage island region

MITSUBISHI ELECTRIC CORP36 citations93
US5731628AMar 24, 1998

Semiconductor device having element with high breakdown voltage

MITSUBISHI ELECTRIC CORP34 citations93
US5561077AOct 1, 1996

Dielectric element isolated semiconductor device and a method of manufacturing the same

MITSUBISHI ELECTRIC CORP20 citations93
US5541430AJul 30, 1996

VDMOS semiconductor device

MITSUBISHI ELECTRIC CORP49 citations93
US5495124AFeb 27, 1996

Semiconductor device with increased breakdown voltage

MITSUBISHI ELECTRIC CORP24 citations93
US5485030AJan 16, 1996

Dielectric element isolated semiconductor device and a method of manufacturing the same

MITSUBISHI ELECTRIC CORP40 citations93
US5428241AJun 27, 1995

High breakdown voltage type semiconductor device

MITSUBISHI ELECTRIC CORP27 citations93
US5372954ADec 13, 1994

Method of fabricating an insulated gate bipolar transistor

MITSUBISHI ELECTRIC CORP30 citations93
US5360746ANov 1, 1994

Method of fabricating a semiconductor device

MITSUBISHI ELECTRIC CORP21 citations93
US5334546AAug 2, 1994

Method of forming a semiconductor device which prevents field concentration

MITSUBISHI ELECTRIC CORP22 citations93
US5204545AApr 20, 1993

Structure for preventing field concentration in semiconductor device and method of forming the same

MITSUBISHI ELECTRIC CORP40 citations93
US5164804ANov 17, 1992

Semiconductor device having high breakdown voltage and low resistance and method of fabricating the same

MITSUBISHI ELECTRIC CORP29 citations93
US6642599B1Nov 4, 2003

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP53 citations92
US6359318B1Mar 19, 2002

Semiconductor device with DMOS and bi-polar transistors

MITSUBISHI ELECTRIC CORP40 citations92
US6191466B1Feb 20, 2001

Semiconductor device containing a diode

MITSUBISHI ELECTRIC CORP21 citations92
US5455439AOct 3, 1995

Semiconductor device which moderates electric field concentration caused by a conductive film formed on a surface thereof

MITSUBISHI ELECTRIC CORP31 citations92
US6376891B1Apr 23, 2002

High voltage breakdown isolation semiconductor device and manufacturing process for making the device

MITSUBISHI ELECTRIC CORP41 citations89
US7723802B2May 25, 2010

Semiconductor device

MITSUBISHI ELECTRIC CORP11 citations84
US6894348B2May 17, 2005

Semiconductor device

MITSUBISHI ELECTRIC CORP13 citations84
US5289019AFeb 22, 1994

Insulated gate bipolar transistor

MITSUBISHI ELECTRIC CORP19 citations82
US5155569AOct 13, 1992

Thyristor device with improved turn-off characteristics

MITSUBISHI ELECTRIC CORP20 citations82
US5200638AApr 6, 1993

A semiconductor device for extracting a signal used to monitor potential of a high voltage island at a low voltage island and method of manufacturing the same

MITSUBISHI ELECTRIC CORP16 citations81
US6921945B2Jul 26, 2005

Semiconductor device with structure for improving breakdown voltage

MITSUBISHI ELECTRIC CORP7 citations74
US6642120B2Nov 4, 2003

Semiconductor circuit

MITSUBISHI ELECTRIC CORP7 citations74
US6472710B2Oct 29, 2002

Field MOS transistor and semiconductor integrated circuit including the same

MITSUBISHI ELECTRIC CORP7 citations74
US6297532B1Oct 2, 2001

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP13 citations74
US5907182AMay 25, 1999

Semiconductor device having element with high breakdown voltage

MITSUBISHI ELECTRIC CORP8 citations74
US5874767AFeb 23, 1999

Semiconductor device including a lateral power device

MITSUBISHI ELECTRIC CORP14 citations74
US5763926AJun 9, 1998

Semiconductor device having a Bi-CMOS transistor including an n-channel MOS transistor

MITSUBISHI ELECTRIC CORP6 citations74
US5624858AApr 29, 1997

Method of manufacturing a semiconductor device with increased breakdown voltage

MITSUBISHI ELECTRIC CORP8 citations74
US5500541AMar 19, 1996

Semiconductor device having voltage sensing element

MITSUBISHI ELECTRIC CORP7 citations74
US5497011AMar 5, 1996

Semiconductor memory device and a method of using the same

MITSUBISHI ELECTRIC CORP13 citations74
US5293056AMar 8, 1994

Semiconductor device with high off-breakdown-voltage and low on resistance

MITSUBISHI ELECTRIC CORP12 citations74
US5270568ADec 14, 1993

Structure for preventing electric field concentration in semiconductor device

MITSUBISHI ELECTRIC CORP13 citations74
US5194394AMar 16, 1993

Thyristor and method of manufacturing the same

MITSUBISHI ELECTRIC CORP11 citations74
US5091766AFeb 25, 1992

Thyristor with first and second independent control electrodes

MITSUBISHI ELECTRIC CORP16 citations74
US5065219ANov 12, 1991

Semiconductor device and fabrication method thereof

MITSUBISHI ELECTRIC CORP7 citations74
US4984063AJan 8, 1991

Semiconductor device

MITSUBISHI ELECTRIC CORP13 citations74
US6518158B1Feb 11, 2003

Method of manufacturing a semiconductor device including a fuse

MITSUBISHI ELECTRIC CORP7 citations73
US5279977AJan 18, 1994

Method of manufacturing a semiconductor device for extracting a signal used to monitor potential of a high voltage island

MITSUBISHI ELECTRIC CORP7 citations73
US5258641ANov 2, 1993

Semiconductor device for extracting a signal used to monitor potential of a high voltage island at a low voltage island and method of manufacturing the same

MITSUBISHI ELECTRIC CORP9 citations73
US5100814AMar 31, 1992

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP10 citations72
US11552073B2Jan 10, 2023

Semiconductor device

MITSUBISHI ELECTRIC CORP1 citations63
US7825430B2Nov 2, 2010

Semiconductor device with a high breakdown voltage device

MITSUBISHI ELECTRIC CORP6 citations63
US7786532B2Aug 31, 2010

Structure of a high breakdown voltage element for use in high power application

MITSUBISHI ELECTRIC CORP4 citations63

TERASHIMA TOMOHIDE

1 patent

YAMASHITA JUNICHI

1 patent

Showing the top 50 of 87 patents by PatentIndex Score.