Inventor

MAKUUCHI MASAMI

JP32 patents

⚠️ This page may combine multiple inventors who share the name “MAKUUCHI MASAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MAKUUCHI MASAMI

HITACHI HIGH TECH CORP

Defect inspection apparatus and defect inspection method

Defect inspection device

Inspection apparatus and inspection method

Defect inspection apparatus and defect inspection method

Inspection apparatus and inspection method of magnetic disk or magnetic head

Examination device

Examination device

Inspection apparatus and inspection method of magnetic disk or magnetic head

Defect inspection apparatus and defect inspection method

Defect inspection device

Defect inspection device and defect inspection method

Inspection device and inspection method thereof

Magnetic characteristic inspecting apparatus and inspecting method using it

Inspection device and measurement device

Contamination-inspecting apparatus and detection circuit

Detection circuit and foreign matter inspection apparatus for semiconductor wafer

Mass spectroscope and its adjusting method

HITACHI LTD

Reader/writer having coil arrangements to restrain electromagnetic field intensity at a distance

Power transmission system, power transmission/communication system and reader and/or writer

Weak signal detection system and electron microscope equipped with same

Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital data

Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe

Medium sensor device and monitoring system

RENESAS TECH CORP

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Semiconductor device, testing and manufacturing methods thereof

MAKUUCHI MASAMI

Inspection equipment and inspection method

Defect inspection method and defect inspection device

HITACHI HIGH TECH ELECT ENG CO

Testing apparatus for conducting a test on a magnetic recording medium or a magnetic head, through recording test data on the magnetic recording medium and reproducing recorded test data therefrom by means of the magnetic head

TAKAHASHI MASAYOSHI

Wideband low noise sensor amplifier circuit

LI WEN

Driver integrated circuit