Inventor
IMAGAWA KENGO
JP17 patents
⚠️ This page may combine multiple inventors who share the name “IMAGAWA KENGO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
10 patentsUS6774680B2Aug 10, 2004
Comparator including a differential transistor pair and a diode arrangement
HITACHI LTD8 citations68
US7816955B2Oct 19, 2010
Ramp generator and circuit pattern inspection apparatus using the same ramp generator
HITACHI LTD3 citations62
US10448923B2Oct 22, 2019
Amplifier circuit and ultrasonic probe
HITACHI LTD1 citations61
US11921241B2Mar 5, 2024
Ultrasonic probe and ultrasonic diagnostic apparatus using thereon
HITACHI LTD0 citations51
US11660076B2May 30, 2023
Ultrasonic probe, ultrasonic diagnostic apparatus, and ultrasonic transmission/reception switching method
HITACHI LTD0 citations51
US11331693B2May 17, 2022
Ultrasonic transducer array and ultrasonic probe
HITACHI LTD0 citations51
US11357476B2Jun 14, 2022
Ultrasonic diagnostic apparatus and probe used for the same
HITACHI LTD0 citations50
US11191527B2Dec 7, 2021
Ultrasonic diagnostic apparatus and probe used for the same
HITACHI LTD0 citations50
US10799213B2Oct 13, 2020
Ultrasound probe, element circuit thereof, and ultrasound diagnostic device using same
HITACHI LTD0 citations40
US10499885B2Dec 10, 2019
Ultrasound system and method, and ultrasound probe
HITACHI LTD0 citations40
RENESAS TECH CORP
4 patentsUS7474290B2Jan 6, 2009
Semiconductor device and testing method thereof
RENESAS TECH CORP7 citations72
US7443373B2Oct 28, 2008
Semiconductor device and the method of testing the same
RENESAS TECH CORP6 citations61
US7358953B2Apr 15, 2008
Semiconductor device and testing method of semiconductor device
RENESAS TECH CORP6 citations60
US7668027B2Feb 23, 2010
Semiconductor device, testing and manufacturing methods thereof
RENESAS TECH CORP4 citations58