Inventor

LEE HWA-CHEOL

KR2 patents

Patents

2 patents

US7689876B2Mar 30, 2010

Real-time optimized testing of semiconductor device

SAMSUNG ELECTRONICS CO LTD6 citations55

US9261555B2Feb 16, 2016

Methods of measuring and controlling inner temperature of a chamber included in a test handler

SAMSUNG ELECTRONICS CO LTD1 citations43