P

Inventor

TERAMOTO AKINOBU

JP70 patents
⚠️ This page may combine multiple inventors who share the name “TERAMOTO AKINOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OHMI TADAHIRO

13 patents
US7521324B2Apr 21, 2009

Semiconductor device and method for manufacturing the same

OHMI TADAHIRO51 citations94
US8399862B2Mar 19, 2013

Ion implanting apparatus and ion implanting method

OHMI TADAHIRO20 citations92
US7663195B2Feb 16, 2010

P-channel power MIS field effect transistor and switching circuit

OHMI TADAHIRO31 citations92
US8575023B2Nov 5, 2013

Contact formation method, semiconductor device manufacturing method, and semiconductor device

OHMI TADAHIRO5 citations73
US8633395B2Jan 21, 2014

Multilayer wiring board

OHMI TADAHIRO3 citations63
US8217270B2Jul 10, 2012

Multilayer circuit board and electronic device

OHMI TADAHIRO2 citations63
US8492879B2Jul 23, 2013

Semiconductor substrate and semiconductor device

OHMI TADAHIRO2 citations62
US8183670B2May 22, 2012

Semiconductor device and method of manufacturing the same

OHMI TADAHIRO4 citations62
US8895410B2Nov 25, 2014

Method of manufacturing semiconductor device and semiconductor manufacturing apparatus

OHMI TADAHIRO0 citations52
US8648393B2Feb 11, 2014

Transistor and semiconductor device

OHMI TADAHIRO0 citations52
US8198195B2Jun 12, 2012

Plasma processing method and plasma processing apparatus

OHMI TADAHIRO1 citations52
US8138527B2Mar 20, 2012

Transistor and semiconductor device

OHMI TADAHIRO1 citations52
US8134376B2Mar 13, 2012

Method of measuring electronic device and measuring apparatus

OHMI TADAHIRO0 citations52

MITSUBISHI ELECTRIC CORP

6 patents
US6683004B1Jan 27, 2004

Method of manufacturing a semiconductor device, and semiconductor device manufactured thereby

MITSUBISHI ELECTRIC CORP10 citations74
US6649969B2Nov 18, 2003

Nonvolatile semiconductor device

MITSUBISHI ELECTRIC CORP12 citations72
US6472700B2Oct 29, 2002

Semiconductor device with isolation insulator, interlayer insulation film, and a sidewall coating film

MITSUBISHI ELECTRIC CORP10 citations72
US6638803B2Oct 28, 2003

Semiconductor device and method for manufacturing the same

MITSUBISHI ELECTRIC CORP2 citations63
US6221771B1Apr 24, 2001

Method of forming tungsten silicide film, method of fabricating semiconductor devices and semiconductor manufactured thereby

MITSUBISHI ELECTRIC CORP5 citations63
US6521509B2Feb 18, 2003

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP2 citations60

UNIV TOHOKU

6 patents
US7898033B2Mar 1, 2011

Semiconductor device

UNIV TOHOKU4 citations63
US7863713B2Jan 4, 2011

Semiconductor device

UNIV TOHOKU2 citations63
US11495452B2Nov 8, 2022

Method for producing silicon nitride film

UNIV TOHOKU0 citations61
US7820558B2Oct 26, 2010

Semiconductor device and method of producing the semiconductor device

UNIV TOHOKU4 citations60
US8999788B2Apr 7, 2015

Manufacturing method of GaN-based semiconductor device and semiconductor device

UNIV TOHOKU1 citations52
US7968470B2Jun 28, 2011

Plasma nitriding method, method for manufacturing semiconductor device and plasma processing apparatus

UNIV TOHOKU1 citations52

UNIV TOHOKU NAT UNIV CORP

5 patents
US7863925B2Jan 4, 2011

Test circuit, wafer, measuring apparatus, and measuring method

UNIV TOHOKU NAT UNIV CORP5 citations74
US7812595B2Oct 12, 2010

Electronic device identifying method

UNIV TOHOKU NAT UNIV CORP7 citations74
US7848828B2Dec 7, 2010

Method and apparatus for managing manufacturing equipment, method for manufacturing device thereby

UNIV TOHOKU NAT UNIV CORP5 citations63
US8362567B2Jan 29, 2013

Semiconductor device

UNIV TOHOKU NAT UNIV CORP3 citations62
US7965097B2Jun 21, 2011

Test circuit, wafer, measuring apparatus, measuring method, device manufacturing method and display apparatus

UNIV TOHOKU NAT UNIV CORP1 citations52

RENESAS TECH CORP

2 patents
US6720601B2Apr 13, 2004

Semiconductor device comprising a gate conductive layer with a stress mitigating film thereon

RENESAS TECH CORP8 citations74
US6756647B2Jun 29, 2004

Semiconductor device including nitride layer

RENESAS TECH CORP2 citations63

TOKYO ELECTRON LTD

1 patent
US8716114B2May 6, 2014

Semiconductor device manufacturing method and semiconductor device

TOKYO ELECTRON LTD40 citations94

SHINKAWA KK

1 patent
US7975901B2Jul 12, 2011

Bonding apparatus and wire bonding method

SHINKAWA KK28 citations92

FOUND ADVANCEMENT INT SCIENCE

1 patent
US7179746B2Feb 20, 2007

Method of surface treatment for manufacturing semiconductor device

FOUND ADVANCEMENT INT SCIENCE16 citations92

SHINETSU HANDOTAI KK

1 patent
US7411274B2Aug 12, 2008

Silicon semiconductor substrate and its manufacturing method

SHINETSU HANDOTAI KK17 citations84

YAZAKI CORP

1 patent
US7928518B2Apr 19, 2011

P-channel power MIS field effect transistor and switching circuit

YAZAKI CORP14 citations83

TERAMOTO AKINOBU

1 patent
US9230799B2Jan 5, 2016

Method for fabricating semiconductor device and the semiconductor device

TERAMOTO AKINOBU14 citations81

WAKAYAMA YOSHIHIDE

1 patent
US8841545B2Sep 23, 2014

Solar cell wherein solar photovolatic thin film is directly formed on base

WAKAYAMA YOSHIHIDE7 citations79

TOSHIBA MITSUBISHI ELECTRIC INDUSTRIAL SYSTEMS CORP

1 patent
US10927454B2Feb 23, 2021

Method of forming nitride film

TOSHIBA MITSUBISHI ELECTRIC INDUSTRIAL SYSTEMS CORP3 citations71

CANON KK

1 patent
US7887385B2Feb 15, 2011

Organic EL light emitting element, manufacturing method thereof, and display device

CANON KK6 citations63

ADVANTEST CORP

1 patent
US7774081B2Aug 10, 2010

Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium

ADVANTEST CORP2 citations63

OKAYASU TOSHIYUKI

1 patent
US8093918B2Jan 10, 2012

Electronic device identifying method and electronic device comprising identification means

OKAYASU TOSHIYUKI2 citations62

FUJI ELECTRIC SYSTEMS CO LTD

1 patent
US7960937B2Jun 14, 2011

Inverter unit, integrated circuit chip, and vehicle drive apparatus

FUJI ELECTRIC SYSTEMS CO LTD3 citations62

KAMBAYASHI HIROSHI

1 patent
US8906796B2Dec 9, 2014

Method of producing semiconductor transistor

KAMBAYASHI HIROSHI2 citations60

KITAGAWA JUNICHI

1 patent
US8067809B2Nov 29, 2011

Semiconductor storage device including a gate insulating film with a favorable nitrogen concentration profile and method for manufacturing the same

KITAGAWA JUNICHI2 citations58

SUMIDA HITOSHI

1 patent
US8405343B2Mar 26, 2013

Inverter unit, integrated circuit chip, and vehicle drive apparatus

SUMIDA HITOSHI2 citations56

SUMITOMO ELECTRIC INDUSTRIES

1 patent
US10043654B2Aug 7, 2018

Method for rinsing compound semiconductor, solution for rinsing compound semiconductor containing gallium as constituent element, method for fabricating compound semiconductor device, method for fabricating gallium nitride substrate, and gallium nitride substrate

SUMITOMO ELECTRIC INDUSTRIES0 citations52

TADAHIRO OHMI

1 patent
US8030182B2Oct 4, 2011

Semiconductor device manufacturing method and semiconductor manufacturing apparatus

TADAHIRO OHMI0 citations52

SHARP KK

1 patent
US7902595B2Mar 8, 2011

Power IC device and method of manufacturing same

SHARP KK1 citations52

Showing the top 50 of 70 patents by PatentIndex Score.