Inventor
ENDO KAMIHISA
JP4 patents
Patents
4 patentsUS6937694B2Aug 30, 2005
Pole measuring method
RIGAKU DENKI CO LTD13 citations82
US7337098B2Feb 26, 2008
Diffraction condition simulation device, diffraction measurement system, and crystal analysis system
RIGAKU DENKI CO LTD4 citations60
US6874369B2Apr 5, 2005
Stress measurement method using X-ray diffraction
RIGAKU DENKI CO LTD5 citations59
US7003074B2Feb 21, 2006
Stress measurement method using X-ray diffraction
RIGAKU DENKI CO LTD1 citations48