Inventor
VAHE JARI
US4 patents
Patents
4 patentsUS6904375B1Jun 7, 2005
Method and circuits for testing high speed devices using low speed ATE testers
XILINX INC58 citations93
US7071679B1Jul 4, 2006
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces
XILINX INC24 citations90
US7420384B1Sep 2, 2008
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces
XILINX INC12 citations81
US7301327B1Nov 27, 2007
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces
XILINX INC6 citations71