Inventor
YEDINAK JOSEPH A
US49 patents
⚠️ This page may combine multiple inventors who share the name “YEDINAK JOSEPH A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FAIRCHILD SEMICONDUCTOR
29 patentsUS7504303B2Mar 17, 2009
Trench-gate field effect transistors and methods of forming the same
FAIRCHILD SEMICONDUCTOR94 citations99
US8013391B2Sep 6, 2011
Power semiconductor devices with trenched shielded split gate transistor and methods of manufacture
FAIRCHILD SEMICONDUCTOR32 citations96
US8043913B2Oct 25, 2011
Method of forming trench-gate field effect transistors
FAIRCHILD SEMICONDUCTOR13 citations92
US8013387B2Sep 6, 2011
Power semiconductor devices with shield and gate contacts and methods of manufacture
FAIRCHILD SEMICONDUCTOR12 citations92
US7923776B2Apr 12, 2011
Trench-gate field effect transistor with channel enhancement region and methods of forming the same
FAIRCHILD SEMICONDUCTOR19 citations92
US7416948B2Aug 26, 2008
Trench FET with improved body to gate alignment
FAIRCHILD SEMICONDUCTOR30 citations92
US7595542B2Sep 29, 2009
Periphery design for charge balance power devices
FAIRCHILD SEMICONDUCTOR31 citations91
US7118951B2Oct 10, 2006
Method of isolating the current sense on power devices while maintaining a continuous stripe cell
FAIRCHILD SEMICONDUCTOR26 citations90
US6906362B2Jun 14, 2005
Method of isolating the current sense on power devices while maintaining a continuous stripe cell
FAIRCHILD SEMICONDUCTOR25 citations90
US6831329B2Dec 14, 2004
Quick punch through IGBT having gate-controllable DI/DT and reduced EMI during inductive turn off
FAIRCHILD SEMICONDUCTOR21 citations90
US6798019B2Sep 28, 2004
IGBT with channel resistors
FAIRCHILD SEMICONDUCTOR22 citations88
US6777747B2Aug 17, 2004
Thick buffer region design to improve IGBT self-clamped inductive switching (SCIS) energy density and device manufacturability
FAIRCHILD SEMICONDUCTOR31 citations88
US8963212B2Feb 24, 2015
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR8 citations84
US8884365B2Nov 11, 2014
Trench-gate field effect transistor
FAIRCHILD SEMICONDUCTOR4 citations84
US7586156B2Sep 8, 2009
Wide bandgap device in parallel with a device that has a lower avalanche breakdown voltage and a higher forward voltage drop than the wide bandgap device
FAIRCHILD SEMICONDUCTOR8 citations82
US8357976B2Jan 22, 2013
Wide bandgap device in parallel with a device that has a lower avalanche breakdown voltage and a higher forward voltage drop than the wide bandgap device
FAIRCHILD SEMICONDUCTOR8 citations81
US7859057B2Dec 28, 2010
Wide bandgap device in parallel with a device that has a lower avalanche breakdown voltage and a higher forward voltage drop than the wide bandgap device
FAIRCHILD SEMICONDUCTOR8 citations81
US9748329B2Aug 29, 2017
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR3 citations73
US9293526B2Mar 22, 2016
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR3 citations73
US8049276B2Nov 1, 2011
Reduced process sensitivity of electrode-semiconductor rectifiers
FAIRCHILD SEMICONDUCTOR6 citations73
US10868113B2Dec 15, 2020
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR2 citations72
US9595596B2Mar 14, 2017
Superjunction structures for power devices
FAIRCHILD SEMICONDUCTOR3 citations72
US10749027B2Aug 18, 2020
Methods and apparatus related to termination regions of a semiconductor device
FAIRCHILD SEMICONDUCTOR2 citations71
US9496391B2Nov 15, 2016
Termination region of a semiconductor device
FAIRCHILD SEMICONDUCTOR5 citations71
US9391193B2Jul 12, 2016
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR1 citations63
US7230313B2Jun 12, 2007
Voltage divider field plate termination with unequal fixed biasing
FAIRCHILD SEMICONDUCTOR4 citations59
US9509227B2Nov 29, 2016
MOSFET bridge circuit
FAIRCHILD SEMICONDUCTOR2 citations56
US8932924B2Jan 13, 2015
Trench-based power semiconductor devices with increased breakdown voltage characteristics
FAIRCHILD SEMICONDUCTOR0 citations52
US9559498B2Jan 31, 2017
Ignition control circuit with dual (two-stage) clamp
FAIRCHILD SEMICONDUCTOR0 citations49
YEDINAK JOSEPH A
12 patentsUS8304829B2Nov 6, 2012
Trench-based power semiconductor devices with increased breakdown voltage characteristics
YEDINAK JOSEPH A52 citations98
US8174067B2May 8, 2012
Trench-based power semiconductor devices with increased breakdown voltage characteristics
YEDINAK JOSEPH A29 citations96
US8889511B2Nov 18, 2014
Methods of manufacturing power semiconductor devices with trenched shielded split gate transistor
YEDINAK JOSEPH A17 citations92
US8673700B2Mar 18, 2014
Superjunction structures for power devices and methods of manufacture
YEDINAK JOSEPH A23 citations92
US8563377B2Oct 22, 2013
Trench-based power semiconductor devices with increased breakdown voltage characteristics
YEDINAK JOSEPH A11 citations92
US8193581B2Jun 5, 2012
Trench-based power semiconductor devices with increased breakdown voltage characteristics
YEDINAK JOSEPH A10 citations92
US8129245B2Mar 6, 2012
Methods of manufacturing power semiconductor devices with shield and gate contacts
YEDINAK JOSEPH A12 citations92
US8564024B2Oct 22, 2013
Trench-based power semiconductor devices with increased breakdown voltage characteristics
YEDINAK JOSEPH A8 citations84
US8772868B2Jul 8, 2014
Superjunction structures for power devices and methods of manufacture
YEDINAK JOSEPH A12 citations82
US8836028B2Sep 16, 2014
Superjunction structures for power devices and methods of manufacture
YEDINAK JOSEPH A8 citations80
US8786010B2Jul 22, 2014
Superjunction structures for power devices and methods of manufacture
YEDINAK JOSEPH A3 citations62
US8492837B2Jul 23, 2013
Reduced process sensitivity of electrode-semiconductor rectifiers
YEDINAK JOSEPH A1 citations51
HARRIS CORP
4 patentsUS5079608AJan 7, 1992
Power MOSFET transistor circuit with active clamp
HARRIS CORP233 citations97
US5164802ANov 17, 1992
Power vdmosfet with schottky on lightly doped drain of lateral driver fet
HARRIS CORP94 citations94
US5323036AJun 21, 1994
Power FET with gate segments covering drain regions disposed in a hexagonal pattern
HARRIS CORP49 citations92
US5218220AJun 8, 1993
Power fet having reduced threshold voltage
HARRIS CORP6 citations62