Inventor
HONG CHIA-NAN
TW3 patents
Patents
3 patentsUS7603598B2Oct 13, 2009
Semiconductor device for testing semiconductor process and method thereof
FARADAY TECH CORP7 citations67
US7078930B2Jul 18, 2006
Integrated circuit chip with high area utilization rate
FARADAY TECH CORP0 citations35
US7516427B2Apr 7, 2009
Input capacitance characterization method in IP library
FARADAY TECH CORP0 citations34