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Inventor
HIGASHIDE KOICHI
JP
2 patents
Patents
2 patents
US6556934B2
Apr 29, 2003
Timing calibration method and semiconductor device testing apparatus having timing calibration function
ADVANTEST CORP
97 citations
90
US6828799B2
Dec 7, 2004
Propagation delay time measuring method and testing apparatus
ADVANTEST CORP
2 citations
58