Inventor

HUET PATRICK

US8 patents

⚠️ This page may combine multiple inventors who share the name “HUET PATRICK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR TECH CORP

4 patents

US7227628B1Jun 5, 2007

Wafer inspection systems and methods for analyzing inspection data

KLA TENCOR TECH CORP58 citations96

US7570797B1Aug 4, 2009

Methods and systems for generating an inspection process for an inspection system

KLA TENCOR TECH CORP83 citations94

US7142992B1Nov 28, 2006

Flexible hybrid defect classification for semiconductor manufacturing

KLA TENCOR TECH CORP28 citations89

US7417724B1Aug 26, 2008

Wafer inspection systems and methods for analyzing inspection data

KLA TENCOR TECH CORP14 citations84

SNECMA MOTEURS

1 patent

US6758438B2Jul 6, 2004

Jet engine suspension

SNECMA MOTEURS38 citations88

HUET PATRICK

1 patent

US8537349B2Sep 17, 2013

Monitoring of time-varying defect classification performance

HUET PATRICK6 citations67

DISHNER MARK

1 patent

US9037280B2May 19, 2015

Computer-implemented methods for performing one or more defect-related functions

DISHNER MARK2 citations51

KLA TENCOR CORP

1 patent

US9489599B2Nov 8, 2016

Decision tree construction for automatic classification of defects on semiconductor wafers

KLA TENCOR CORP0 citations36