Inventor
OZAWA YUICHI
JP12 patents
⚠️ This page may combine multiple inventors who share the name “OZAWA YUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO SEIMITSU CO LTD
4 patentsUS9664733B2May 30, 2017
Probe device for testing electrical characteristics of semiconductor element
TOKYO SEIMITSU CO LTD3 citations71
US9442156B2Sep 13, 2016
Alignment support device and alignment support method for probe device
TOKYO SEIMITSU CO LTD2 citations60
US10481177B2Nov 19, 2019
Wafer inspection method
TOKYO SEIMITSU CO LTD1 citations56
US9983256B2May 29, 2018
Probing device for electronic device and probing method
TOKYO SEIMITSU CO LTD0 citations46