Inventor
NA KWANG JIN
KR33 patents
⚠️ This page may combine multiple inventors who share the name “NA KWANG JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
15 patentsUS7173866B2Feb 6, 2007
Circuit for generating data strobe signal in DDR memory device, and method therefor
HYNIX SEMICONDUCTOR INC17 citations92
US7023254B2Apr 4, 2006
Duty ratio corrector, and memory device having the same
HYNIX SEMICONDUCTOR INC15 citations92
US6982924B2Jan 3, 2006
Data output control circuit
HYNIX SEMICONDUCTOR INC37 citations92
US7778095B2Aug 17, 2010
Semiconductor memory device and method for driving the same
HYNIX SEMICONDUCTOR INC16 citations84
US7492200B2Feb 17, 2009
Delayed locked loop (DLL)
HYNIX SEMICONDUCTOR INC9 citations84
US7312647B2Dec 25, 2007
Memory device having a duty ratio corrector
HYNIX SEMICONDUCTOR INC10 citations84
US7800957B2Sep 21, 2010
Data output circuit in semiconductor memory apparatus
HYNIX SEMICONDUCTOR INC5 citations63
US7671649B2Mar 2, 2010
Apparatus and method for generating multi-phase clocks
HYNIX SEMICONDUCTOR INC2 citations63
US7605624B2Oct 20, 2009
Delay locked loop (DLL) circuit for generating clock signal for memory device
HYNIX SEMICONDUCTOR INC2 citations63
US7317337B2Jan 8, 2008
Output driver in semiconductor device
HYNIX SEMICONDUCTOR INC6 citations63
US7983101B2Jul 19, 2011
Circuit for generating data strobe signal in DDR memory device and method therefor
HYNIX SEMICONDUCTOR INC4 citations62
US7710799B2May 4, 2010
Circuit for generating data strobe in DDR memory device, and method therefor
HYNIX SEMICONDUCTOR INC4 citations62
US7190203B2Mar 13, 2007
Memory device having a duty ratio corrector
HYNIX SEMICONDUCTOR INC4 citations62
US8344775B2Jan 1, 2013
Clock delay correcting device and semiconductor device having the same
HYNIX SEMICONDUCTOR INC0 citations52
US7911246B2Mar 22, 2011
DLL circuit and method of controlling the same
HYNIX SEMICONDUCTOR INC0 citations52
SK HYNIX INC
8 patentsUS9270285B2Feb 23, 2016
Semiconductor chips and semiconductor systems for executing a test mode
SK HYNIX INC5 citations73
US9030907B2May 12, 2015
Semiconductor device and semiconductor system with the same
SK HYNIX INC4 citations73
US8829960B2Sep 9, 2014
Delay locked loop circuit and method of driving the same
SK HYNIX INC6 citations73
US9496878B2Nov 15, 2016
Phase-locked loop and integrated circuit chip including the same, and test system including the integrated circuit chip
SK HYNIX INC4 citations72
US9601173B2Mar 21, 2017
Semiconductor system
SK HYNIX INC0 citations52
US9077438B2Jul 7, 2015
Noise detection circuit, delay locked loop and duty cycle corrector including the same
SK HYNIX INC0 citations52
US9659905B2May 23, 2017
Semiconductor package and semiconductor system including the same
SK HYNIX INC0 citations49
US9281051B2Mar 8, 2016
Semiconductor package
SK HYNIX INC0 citations49
HYUNDAI ELECTRONICS IND
3 patentsUS6157238ADec 5, 2000
Clock system of a semiconductor memory device employing a frequency amplifier
HYUNDAI ELECTRONICS IND22 citations92
US6255870B1Jul 3, 2001
Apparatus for compensating locking error in high speed memory device with delay locked loop
HYUNDAI ELECTRONICS IND16 citations84
US6246636B1Jun 12, 2001
Load signal generating circuit of a packet command driving type memory device
HYUNDAI ELECTRONICS IND6 citations63
NA KWANG-JIN
3 patentsUS8144542B2Mar 27, 2012
Semiconductor memory apparatus and method for operating the same
NA KWANG-JIN14 citations83
US8514639B2Aug 20, 2013
Semiconductor memory device and method for operating the same
NA KWANG-JIN1 citations51
US8222934B2Jul 17, 2012
DLL circuit and method of controlling the same
NA KWANG-JIN0 citations51