Inventor
YANO KAZUYA
JP22 patents
⚠️ This page may combine multiple inventors who share the name “YANO KAZUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SUMITOMO ELECTRIC HARDMETAL CORP
10 patentsUSD910093SFeb 9, 2021
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP15 citations94
USD882653SApr 28, 2020
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP12 citations94
USD847231SApr 30, 2019
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP11 citations84
USD844683SApr 2, 2019
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP8 citations83
USD844034SMar 26, 2019
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP9 citations83
USD794691SAug 15, 2017
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP5 citations83
USD888786SJun 30, 2020
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP1 citations73
USD857069SAug 20, 2019
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP3 citations73
USD856387SAug 13, 2019
Drilling tool
SUMITOMO ELECTRIC HARDMETAL CORP3 citations73
US9707629B2Jul 18, 2017
Cutting tool
SUMITOMO ELECTRIC HARDMETAL CORP2 citations72
TOKYO ELECTRON LTD
7 patentsUS7701236B2Apr 20, 2010
Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer
TOKYO ELECTRON LTD16 citations82
US9684014B2Jun 20, 2017
Prober for inspecting semiconductor devices formed on semiconductor wafer
TOKYO ELECTRON LTD3 citations71
US7940065B2May 10, 2011
Probe apparatus and method for measuring electrical characteristics of chips
TOKYO ELECTRON LTD6 citations63
US9383389B2Jul 5, 2016
Prober and needle-tip polishing device for probe card
TOKYO ELECTRON LTD1 citations52
US7963513B2Jun 21, 2011
Mounting device
TOKYO ELECTRON LTD0 citations42
US9523711B2Dec 20, 2016
Probe apparatus and wafer mounting table for probe apparatus
TOKYO ELECTRON LTD0 citations41
US9261553B2Feb 16, 2016
Probe apparatus
TOKYO ELECTRON LTD0 citations39