Inventor
INOMATA ISAMU
JP6 patents
⚠️ This page may combine multiple inventors who share the name “INOMATA ISAMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
4 patentsUS7688096B2Mar 30, 2010
Contact load measuring apparatus and inspecting apparatus
TOKYO ELECTRON LTD13 citations79
US9684014B2Jun 20, 2017
Prober for inspecting semiconductor devices formed on semiconductor wafer
TOKYO ELECTRON LTD3 citations71
US6433566B1Aug 13, 2002
Probing method and probing system
TOKYO ELECTRON LTD1 citations48
US9261553B2Feb 16, 2016
Probe apparatus
TOKYO ELECTRON LTD0 citations39
YAMAMOTO YASUHITO
2 patentsUS8081007B2Dec 20, 2011
Inspection apparatus and method for inspecting electric characteristics of devices formed on target object
YAMAMOTO YASUHITO4 citations57
US8536891B2Sep 17, 2013
Inspection method for inspecting electric characteristics of devices formed on target object
YAMAMOTO YASUHITO0 citations47