P

Inventor

KALNITSKY ALEXANDER

US271 patents
⚠️ This page may combine multiple inventors who share the name “KALNITSKY ALEXANDER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAT SEMICONDUCTOR CORP

27 patents
US6208557B1Mar 27, 2001

EPROM and flash memory cells with source-side injection and a gate dielectric that traps hot electrons during programming

NAT SEMICONDUCTOR CORP220 citations99
US6137723AOct 24, 2000

Memory device having erasable Frohmann-Bentchkowsky EPROM cells that use a well-to-floating gate coupled voltage during erasure

NAT SEMICONDUCTOR CORP118 citations98
US6137724AOct 24, 2000

Memory device that utilizes single-poly EPROM cells with CMOS compatible programming voltages

NAT SEMICONDUCTOR CORP63 citations96
US6137722AOct 24, 2000

Memory array having Frohmann-Bentchkowsky EPROM cells with a reduced number of access transistors

NAT SEMICONDUCTOR CORP59 citations96
US6081451AJun 27, 2000

Memory device that utilizes single-poly EPROM cells with CMOS compatible programming voltages

NAT SEMICONDUCTOR CORP71 citations96
US6055185AApr 25, 2000

Single-poly EPROM cell with CMOS compatible programming voltages

NAT SEMICONDUCTOR CORP68 citations96
US5982669ANov 9, 1999

EPROM and flash memory cells with source-side injection

NAT SEMICONDUCTOR CORP57 citations95
US6525397B1Feb 25, 2003

Extended drain MOSFET for programming an integrated fuse element to high resistance in low voltage process technology

NAT SEMICONDUCTOR CORP38 citations93
US6420217B1Jul 16, 2002

Method of an apparatus for programming an integrated fuse element to high resistance in low voltage technology

NAT SEMICONDUCTOR CORP33 citations93
US6384398B1May 7, 2002

CMOS compatible pixel cell that utilizes a gated diode to reset the cell

NAT SEMICONDUCTOR CORP17 citations93
US6380571B1Apr 30, 2002

CMOS compatible pixel cell that utilizes a gated diode to reset the cell

NAT SEMICONDUCTOR CORP16 citations93
US6368917B1Apr 9, 2002

Methods of fabricating floating gate semiconductor device with reduced erase voltage

NAT SEMICONDUCTOR CORP17 citations93
US6362023B1Mar 26, 2002

Dielectric-based anti-fuse cell with polysilicon contact plug and method for its manufacture

NAT SEMICONDUCTOR CORP20 citations93
US6271560B1Aug 7, 2001

Single-poly EPROM cell with CMOS compatible programming voltages

NAT SEMICONDUCTOR CORP27 citations93
US6249010B1Jun 19, 2001

Dielectric-based anti-fuse cell with polysilicon contact plug and method for its manufacture

NAT SEMICONDUCTOR CORP37 citations93
US6236082B1May 22, 2001

Floating gate semiconductor device with reduced erase voltage

NAT SEMICONDUCTOR CORP26 citations93
US6177315B1Jan 23, 2001

Method of fabricating a high density EEPROM array

NAT SEMICONDUCTOR CORP33 citations93
US6166421ADec 26, 2000

Polysilicon fuse that provides an open current path when programmed without exposing the fuse to the environment

NAT SEMICONDUCTOR CORP26 citations93
US6157574ADec 5, 2000

Erasable frohmann-bentchkowsky memory transistor that stores multiple bits of data

NAT SEMICONDUCTOR CORP43 citations93
US6137721AOct 24, 2000

Memory device having erasable frohmann-bentchkowsky EPROM cells that use a plate-to-floating gate coupled voltage during erasure

NAT SEMICONDUCTOR CORP50 citations93
US6130840AOct 10, 2000

Memory cell having an erasable Frohmann-Bentchkowsky memory transistor

NAT SEMICONDUCTOR CORP34 citations93
US6122204ASep 19, 2000

Sense amplifier having a bias circuit with a reduced size

NAT SEMICONDUCTOR CORP26 citations93
US6087211AJul 11, 2000

Method for forming a semiconductor device having non-volatile memory cells, High-voltage transistors, and low-voltage, deep sub-micron transistors

NAT SEMICONDUCTOR CORP45 citations93
US6031275AFeb 29, 2000

Antifuse with a silicide layer overlying a diffusion region

NAT SEMICONDUCTOR CORP25 citations93
US6190968B1Feb 20, 2001

Method for forming EPROM and flash memory cells with source-side injection

NAT SEMICONDUCTOR CORP35 citations92
US6184557B1Feb 6, 2001

I/O circuit that utilizes a pair of well structures as resistors to delay an ESD event and as diodes for ESD protection

NAT SEMICONDUCTOR CORP40 citations92
US6169310B1Jan 2, 2001

Electrostatic discharge protection device

NAT SEMICONDUCTOR CORP34 citations92

SGS THOMSON MICROELECTRONICS

6 patents

ST MICROELECTRONICS INC

5 patents

TAIWAN SEMICONDUCTOR MFG CO LTD

3 patents

MAXIM INTEGRATED PRODUCTS

3 patents

UPEK INC

2 patents

KALNITSKY ALEXANDER

2 patents

INTERSIL INC

2 patents

Showing the top 50 of 271 patents by PatentIndex Score.