Inventor
KANAI KENICHI
JP42 patents
⚠️ This page may combine multiple inventors who share the name “KANAI KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SONY CORP
12 patentsUS9826248B2Nov 21, 2017
Decoding device and decoding method, and coding device and coding method
SONY CORP7 citations84
US9264683B2Feb 16, 2016
Decoding device and decoding method, encoding device, and encoding method
SONY CORP5 citations84
US9253497B2Feb 2, 2016
Decoding device and decoding method, and coding device and coding method
SONY CORP6 citations84
US10798398B2Oct 6, 2020
Decoding device and decoding method, encoding device, and encoding method
SONY CORP2 citations73
US10728567B2Jul 28, 2020
Decoding device and decoding method, encoding device, and encoding method
SONY CORP2 citations73
US10595034B2Mar 17, 2020
Decoding device and decoding method, and coding device and coding method
SONY CORP2 citations73
US10187651B2Jan 22, 2019
Decoding device and decoding method, and coding device and coding method
SONY CORP2 citations73
US10015505B2Jul 3, 2018
Decoding device and decoding method, encoding device, and encoding method
SONY CORP3 citations73
US10192294B2Jan 29, 2019
Image processing apparatus and image processing method for display mapping
SONY CORP5 citations71
US10565695B2Feb 18, 2020
Apparatus and method for transmitting and receiving high dynamic range images
SONY CORP1 citations61
US11272224B2Mar 8, 2022
Information processing device and method
SONY CORP0 citations52
US10638023B2Apr 28, 2020
Image processing apparatus and image processing method
SONY CORP0 citations52
ASML NETHERLANDS BV
6 patentsUS11508547B2Nov 22, 2022
Semiconductor charged particle detector for microscopy
ASML NETHERLANDS BV4 citations72
US12205792B2Jan 21, 2025
Semiconductor charged particle detector for microscopy
ASML NETHERLANDS BV0 citations61
US12342635B2Jun 24, 2025
Semiconductor detector and method of fabricating same
ASML NETHERLANDS BV0 citations54
US11843069B2Dec 12, 2023
Semiconductor detector and method of fabricating same
ASML NETHERLANDS BV0 citations54
US12573581B2Mar 10, 2026
Electron optical column and method for directing a beam of primary electrons onto a sample
ASML NETHERLANDS BV0 citations53
US12567558B2Mar 3, 2026
Systems and methods for pulsed voltage contrast detection and capture of charging dynamics
ASML NETHERLANDS BV0 citations48
OTSUKA PHARMA CO LTD
4 patentsUS5059598AOct 22, 1991
N-heterocyclo-substituted p-aminophenols
OTSUKA PHARMA CO LTD16 citations81
US4868183ASep 19, 1989
N-pyrazinyl substituted P-aminophenols
OTSUKA PHARMA CO LTD21 citations81
US5104889AApr 14, 1992
Thiazole derivatives
OTSUKA PHARMA CO LTD17 citations73
US5187161AFeb 16, 1993
P-aminophenol derivatives, and processes for production of and uses for the same
OTSUKA PHARMA CO LTD1 citations51
HERMES MICROVISION INC
3 patentsUS9991147B2Jun 5, 2018
Wafer grounding and biasing method, apparatus, and application
HERMES MICROVISION INC15 citations84
US8003953B2Aug 23, 2011
Multi-axis magnetic lens
HERMES MICROVISION INC18 citations84
US7982186B2Jul 19, 2011
Method and apparatus for obtaining images by raster scanning charged particle beam over patterned substrate on a continuous mode stage
HERMES MICROVISION INC6 citations63