Inventor

ARORA PUNEET

IN28 patents

⚠️ This page may combine multiple inventors who share the name “ARORA PUNEET”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ARORA PUNEET

CADENCE DESIGN SYSTEMS INC

Method and apparatus for testing error correction code (ECC) logic and physical memory onboard a manufactured integrated circuit (IC)

Power domain aware insertion methods and designs for testing and repairing memory

Simulation event reduction and power control during MBIST through clock tree management

Systems, methods, and computer-readable media utilizing improved data structures and design flow for programmable memory built-in self-test (PMBIST)

Customizable built-in self-test testplans for memory units

Memory built-in self-test logic in an integrated circuit design

Test logic at register transfer level in an integrated circuit design

Failing read count diagnostics for memory built-in self-test

Launch off shift process

Systems and methods for scan chain stitching

Memory view for non-volatile memory module

Control algorithm generator for non-volatile memory module

Multiple-channel, programmable fuse control unit

Dynamic diagnostics analysis for memory built-in self-test

Register-transfer level design engineering change order strategy

Automated method identifying physical memories within a core or macro integrated circuit design

Memory view for memory module

Power consumption estimation of memory under test

ARORA PUNEET

Method and apparatus for optimizing memory-built-in-self test

Apparatus and methods of passive cooling electronic components

Pharmaceutical representative expense report management software, systems, and methodologies

MICROSOFT TECHNOLOGY LICENSING LLC

Transforming collections of curated web data

Transforming collections of curated web data

ATLASSIAN PTY LTD

Apparatuses, methods, and computer program products for the programmatic documentation of extrinsic event based data objects in a collaborative documentation service

CHAKRAVADHANULA KRISHNA

Testing state retention logic in low power systems

GREGOR STEVEN LEE

Low cost production testing for memory

CARD NORMAN

Method and apparatus for optimizing memory-built-in-self test

EMC IP HOLDING CO LLC

Transaction visibility frameworks implemented using artificial intelligence