Inventor

YAMAOKA TAKEHIRO

JP5 patents

⚠️ This page may combine multiple inventors who share the name “YAMAOKA TAKEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEIKO INSTR INC

3 patents

US4874460AOct 17, 1989

Method and apparatus for modifying patterned film

SEIKO INSTR INC73 citations94

US6405583B1Jun 18, 2002

Correlation sample for scanning probe microscope and method of processing the correlation sample

SEIKO INSTR INC16 citations83

US6596992B2Jul 22, 2003

Method of operating scanning probe microscope

SEIKO INSTR INC12 citations69

SII NANOTECHNOLOGY INC

1 patent

US6941798B2Sep 13, 2005

Scanning probe microscope and operation method

SII NANOTECHNOLOGY INC18 citations83

HITACHI HIGH-TECH SCIENCE CORP

1 patent

US9823208B2Nov 21, 2017

Method for measuring spreading resistance and spreading resistance microscope

HITACHI HIGH-TECH SCIENCE CORP1 citations51