Inventor

HIRAI TAKEHIRO

JP86 patents

⚠️ This page may combine multiple inventors who share the name “HIRAI TAKEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HIRAI TAKEHIRO

HITACHI HIGH TECH CORP

Inspection method for semiconductor wafer and apparatus for reviewing defects

Observation device and observation method

Apparatus and method for classifying defects using multiple classification modules

Method and apparatus for reviewing defects by detecting images having voltage contrast

Automatic defect review and classification system

Defect inspection method and defect inspection device

Defect observation method and defect observation device

Defect classification apparatus and defect classification method

Sample observation device and sample observation method

Defect observation method and defect observation device

Method for reviewing a defect and apparatus

Report format setting method and apparatus, and defect review system

Automatic defect review and classification system

Method and apparatus for reviewing defects by detecting images having voltage contrast

Sample observation device and sample observation method

Defect observation device and defect observation method

Defect observation system and defect observation method for semiconductor wafer

Defect quantification method, defect quantification device, and defect evaluation value display device

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

High frequency ring gate MOSFET

Semiconductor device and associated fabrication method

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method of fabricating the same

Semiconductor device with a particular DMISFET structure

Semiconductor Bi-MIS device

Method of manufacturing Bi-MOS device

Semiconductor Bi-MIS device and method of manufacturing the same

Semiconductor device including IIL and vertical transistors

Method of fabricating iil and vertical complementary bipolar transistors

Method of manufacturing a semiconductor apparatus

Method of manufacturing a bipolar transistor

Semiconductor device

Semiconductor device and method of manufacturing the same

Method of fabricating semiconductor device

MINEKAWA YOHEI

Defect classification method, and defect classification system

Method and apparatus for reviewing defect

Defect observation method and defect observation device

DAIICHI SANKYO CO LTD

Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate

Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate

NAKAGAKI RYO

Defect review method and apparatus

Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination method

HARADA MINORU

Inspection method and device therefor

Defect inspection method and defect inspection device

HIRAI TAKEHIRO

Charged particle beam apparatus that performs image classification assistance

Method for optimizing observed image classification criterion and image classification apparatus

HITACHI LTD

Investigation device and investigation method

TAKAGI YUJI

Method and device for testing defect using SEM

HAYAKAWA KOICHI

Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program

OBARA KENJI

Inspection method for semiconductor wafer and apparatus for reviewing defects