Inventor
VYSTAV{HACEK OVER (E)}L TOMÁ{HACEK OVER (S)}
CZ12 patents
Patents
12 patentsUS9618463B2Apr 11, 2017
Method of acquiring EBSP patterns
FEI CO9 citations79
US10784076B2Sep 22, 2020
3D defect characterization of crystalline samples in a scanning type electron microscope
FEI CO4 citations68
US10504689B2Dec 10, 2019
Method for sample orientation for TEM lamella preparation
FEI CO3 citations63
US11195693B1Dec 7, 2021
Method and system for dynamic band contrast imaging
FEI CO0 citations60
US12002194B2Jun 4, 2024
Training an artificial neural network using simulated specimen images
FEI CO0 citations57
US10170275B2Jan 1, 2019
Cryogenic specimen processing in a charged particle microscope
FEI CO1 citations55
US11815479B2Nov 14, 2023
Method of examining a sample using a charged particle beam apparatus
FEI CO1 citations53
US11017980B2May 25, 2021
Method of manipulating a sample in an evacuated chamber of a charged particle apparatus
FEI CO0 citations48
US10846845B2Nov 24, 2020
Training an artificial neural network using simulated specimen images
FEI CO0 citations47
US9762863B2Sep 12, 2017
Method of sampling a sample and displaying obtained information
FEI CO1 citations44
US11499926B2Nov 15, 2022
Method for diffraction pattern acquisition
FEI CO0 citations40
US9958403B1May 1, 2018
Arrangement for X-Ray tomography
FEI CO0 citations38