Inventor

POTOCEK PAVEL

NL27 patents

⚠️ This page may combine multiple inventors who share the name “POTOCEK PAVEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

POTOCEK PAVEL

FEI CO

Charged particle microscope providing depth-resolved imagery

Adaptive specimen image acquisition using an artificial neural network

Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging

Computational scanning microscopy with improved resolution

Charged particle microscope with special aperture plate

Charge reduction by digital image correlation

Adaptive specimen image acquisition using an artificial neural network

Adaptive specimen image acquisition

Application management for charged particle microscope devices

Live-assisted image acquisition method and system with charged particle microscopy

Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

Sparse image reconstruction from neighboring tomography tilt images

Training an artificial neural network using simulated specimen images

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images

Low keV ion beam image restoration by machine learning for object localization

Data acquisition in charged particle microscopy

Charged particle microscope scan masking for three-dimensional reconstruction

Composite scan path in a charged particle microscope

Charged-particle microscope providing depth-resolved imagery

Training an artificial neural network using simulated specimen images

Method of analyzing surface modification of a specimen in a charged-particle microscope

Method of analyzing surface modification of a specimen in a charged-particle microscope

Depth reconstruction for 3D images of samples in a charged particle system

Three-dimensional imaging in charged-particle microscopy

BOUGHORBEL FAYSAL

Charged-particle microscope providing depth-resolved imagery