Inventor
MASUDA NORIYUKI
JP16 patents
⚠️ This page may combine multiple inventors who share the name “MASUDA NORIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
8 patentsUS6374392B1Apr 16, 2002
Semiconductor test system
ADVANTEST CORP25 citations92
US6032282AFeb 29, 2000
Timing edge forming circuit for IC test system
ADVANTEST CORP37 citations92
US5970073AOct 19, 1999
Test pattern generator circuit for IC testing equipment
ADVANTEST CORP20 citations92
US5886564AMar 23, 1999
Temperature compensation circuit for IC chip
ADVANTEST CORP25 citations92
US5900761AMay 4, 1999
Timing generating circuit and method
ADVANTEST CORP19 citations82
US5488325AJan 30, 1996
Timing generator intended for semiconductor testing apparatus
ADVANTEST CORP18 citations73
US9702901B2Jul 11, 2017
Test carrier
ADVANTEST CORP0 citations51
US9817024B2Nov 14, 2017
Test carrier for mounting and testing an electronic device
ADVANTEST CORP0 citations39