Inventor
LEE JIANN-RONG
US12 patents
Patents
12 patentsUS6034774AMar 7, 2000
Method for determining the retardation of a material using non-coherent light interferometery
EASTMAN KODAK CO55 citations96
US6624891B2Sep 23, 2003
Interferometric-based external measurement system and method
EASTMAN KODAK CO51 citations91
US6512587B1Jan 28, 2003
Measurement method and apparatus of an external digital camera imager assembly
EASTMAN KODAK CO32 citations90
US6067161AMay 23, 2000
Apparatus for measuring material thickness profiles
EASTMAN KODAK CO22 citations90
US6038027AMar 14, 2000
Method for measuring material thickness profiles
EASTMAN KODAK CO35 citations90
US6724487B2Apr 20, 2004
Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness
EASTMAN KODAK CO22 citations89
US6034772AMar 7, 2000
Method for processing interferometric measurement data
EASTMAN KODAK CO16 citations84
US6522410B1Feb 18, 2003
Method for processing low coherence interferometric data
EASTMAN KODAK CO9 citations73
US5757485AMay 26, 1998
Digital camera image sensor positioning method including a non-coherent interferometer
EASTMAN KODAK CO16 citations73
US6614534B1Sep 2, 2003
Method and apparatus for combined measurement of surface non-uniformity index of refraction variation and thickness variation
EASTMAN KODAK CO11 citations72
US6587210B2Jul 1, 2003
Measurement method and apparatus of an external digital camera imager assembly
EASTMAN KODAK CO2 citations60
US6587209B2Jul 1, 2003
Measurement method and apparatus of an external digital camera imager assembly
EASTMAN KODAK CO0 citations50