P

Inventor

ALMOGY GILAD

US137 patents
⚠️ This page may combine multiple inventors who share the name “ALMOGY GILAD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

18 patents
US6122046ASep 19, 2000

Dual resolution combined laser spot scanning and area imaging inspection

APPLIED MATERIALS INC227 citations99
US6841787B2Jan 11, 2005

Maskless photon-electron spot-grid array printer

APPLIED MATERIALS INC111 citations98
US6317514B1Nov 13, 2001

Method and apparatus for inspection of patterned semiconductor wafers

APPLIED MATERIALS INC106 citations98
US6236454B1May 22, 2001

Multiple beam scanner for an inspection system

APPLIED MATERIALS INC106 citations98
US6208751B1Mar 27, 2001

Cluster tool

APPLIED MATERIALS INC97 citations98
US6639201B2Oct 28, 2003

Spot grid array imaging system

APPLIED MATERIALS INC85 citations97
US6897941B2May 24, 2005

Optical spot grid array printer

APPLIED MATERIALS INC56 citations96
US6671398B2Dec 30, 2003

Method and apparatus for inspection of patterned semiconductor wafers

APPLIED MATERIALS INC53 citations96
US6124924ASep 26, 2000

Focus error correction method and apparatus

APPLIED MATERIALS INC73 citations94
US6671042B1Dec 30, 2003

Multiple beam scanner for an inspection system

APPLIED MATERIALS INC24 citations93
US6587193B1Jul 1, 2003

Inspection systems performing two-dimensional imaging with line light spot

APPLIED MATERIALS INC28 citations93
US6861660B2Mar 1, 2005

Process and assembly for non-destructive surface inspection

APPLIED MATERIALS INC22 citations92
US6853446B1Feb 8, 2005

Variable angle illumination wafer inspection system

APPLIED MATERIALS INC52 citations92
US6791099B2Sep 14, 2004

Laser scanning wafer inspection using nonlinear optical phenomena

APPLIED MATERIALS INC47 citations92
US6657714B2Dec 2, 2003

Defect detection with enhanced dynamic range

APPLIED MATERIALS INC43 citations92
US6366352B1Apr 2, 2002

Optical inspection method and apparatus utilizing a variable angle design

APPLIED MATERIALS INC32 citations92
US7098468B2Aug 29, 2006

Raster frame beam system for electron beam lithography

APPLIED MATERIALS INC14 citations90
US7760347B2Jul 20, 2010

Design-based method for grouping systematic defects in lithography pattern writing system

APPLIED MATERIALS INC22 citations89

ULTIMA GENOMICS INC

14 patents

SUNPOWER CORP

10 patents

COGENRA SOLAR INC

3 patents

FULFIL SOLUTIONS INC

2 patents

ALMOGY GILAD

1 patent

APPLIED MATERIALS ISRAEL LTD

1 patent

ALMOGY GAL

1 patent

Showing the top 50 of 137 patents by PatentIndex Score.