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Inventor
KIMURA YUUSHIN
JP
2 patents
⚠️ This page may combine multiple inventors who share the name “KIMURA YUUSHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WATANABE YUICHI
1 patent
US8736295B2
May 27, 2014
Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method
WATANABE YUICHI
4 citations
65
FUJITSU LTD
1 patent
US7355421B2
Apr 8, 2008
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method
FUJITSU LTD
2 citations
57