Inventor
JEONG SEONG HOON
KR50 patents
⚠️ This page may combine multiple inventors who share the name “JEONG SEONG HOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
19 patentsUS7968442B2Jun 28, 2011
Fin field effect transistor and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD11 citations83
US9916414B2Mar 13, 2018
Apparatus and method for generating test cases for processor verification, and verification device
SAMSUNG ELECTRONICS CO LTD12 citations82
US9247199B2Jan 26, 2016
Method of providing information-of-users' interest when video call is made, and electronic apparatus thereof
SAMSUNG ELECTRONICS CO LTD3 citations73
US10056491B2Aug 21, 2018
Semiconductor devices including gate dielectric structures
SAMSUNG ELECTRONICS CO LTD2 citations72
US9252244B2Feb 2, 2016
Methods of selectively growing source/drain regions of fin field effect transistor and method of manufacturing semiconductor device including a fin field effect transistor
SAMSUNG ELECTRONICS CO LTD4 citations70
US8853660B2Oct 7, 2014
Semiconductor memory devices having lower and upper interconnections, selection components and memory components
SAMSUNG ELECTRONICS CO LTD4 citations68
US10379983B2Aug 13, 2019
Simulation device and distribution simulation system
SAMSUNG ELECTRONICS CO LTD1 citations62
US11881508B2Jan 23, 2024
Method of fabricating a semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations61
US11380760B2Jul 5, 2022
Semiconductor device including a densified device isolation layer
SAMSUNG ELECTRONICS CO LTD0 citations61
US9373703B2Jun 21, 2016
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations61
US10319858B2Jun 11, 2019
Semiconductor devices having lower and upper fins and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US10055318B2Aug 21, 2018
Method and apparatus for generating test bench for verification of processor decoder
SAMSUNG ELECTRONICS CO LTD0 citations52
US9772917B2Sep 26, 2017
Method and apparatus for generating test bench for verification of processor decoder
SAMSUNG ELECTRONICS CO LTD1 citations52
US10847611B2Nov 24, 2020
Semiconductor device including patterns and layers having different helium concentrations and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations50
US9710933B2Jul 18, 2017
Method and apparatus for processing texture
SAMSUNG ELECTRONICS CO LTD0 citations50
US8987694B2Mar 24, 2015
Semiconductor devices having a vertical diode and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations48
US9141498B2Sep 22, 2015
Method for verification of reconfigurable processor
SAMSUNG ELECTRONICS CO LTD0 citations47
US10019349B2Jul 10, 2018
Cache memory and method of managing the same
SAMSUNG ELECTRONICS CO LTD0 citations39
US9202844B2Dec 1, 2015
Semiconductor devices having blocking layers and methods of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations39
LG ELECTRONICS INC
7 patentsUS8027297B2Sep 27, 2011
Method for transmitting downlink control signal
LG ELECTRONICS INC45 citations98
US8351370B2Jan 8, 2013
Method of transmitting scheduling request signal
LG ELECTRONICS INC25 citations93
US7995553B2Aug 9, 2011
Method for transmitting control signal using efficient multiplexing
LG ELECTRONICS INC4 citations74
US9451613B2Sep 20, 2016
Method for transmitting control signal using efficient multiplexing
LG ELECTRONICS INC2 citations63
US7953061B2May 31, 2011
Method for transmitting control signal using efficient multiplexing
LG ELECTRONICS INC2 citations63
US9967064B2May 8, 2018
Method for transmitting control signal using efficient multiplexing
LG ELECTRONICS INC0 citations52
US9729282B2Aug 8, 2017
Method for transmitting control signal using efficient multiplexing
LG ELECTRONICS INC0 citations52
PHICOM CORP
3 patentsUS7867790B2Jan 11, 2011
Substrate of probe card and method for regenerating thereof
PHICOM CORP8 citations80
US7975380B2Jul 12, 2011
Method of fabricating a probe card
PHICOM CORP2 citations56
US7579855B2Aug 25, 2009
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby
PHICOM CORP1 citations51
KIM HAK SEONG
3 patentsUSRE44564EOct 29, 2013
Method for transmitting control signal using efficient multiplexing
KIM HAK SEONG4 citations74
US9106379B2Aug 11, 2015
Method for transmitting control signal using efficient multiplexing
KIM HAK SEONG0 citations52
US8509175B2Aug 13, 2013
Method for transmitting downlink control signal
KIM HAK SEONG0 citations52
RYU JEONG-DO
3 patentsUS9190495B2Nov 17, 2015
Recessed channel array transistors, and semiconductor devices including a recessed channel array transistor
RYU JEONG-DO1 citations49
US8501611B2Aug 6, 2013
Methods of forming integrated circuit devices having electrically conductive layers therein with partially nitridated sidewalls
RYU JEONG-DO0 citations49
US8252681B2Aug 28, 2012
Methods of forming integrated circuit devices having electrically conductive layers therein with partially nitridated sidewalls
RYU JEONG-DO0 citations49
GENEXINE INC
2 patentsHYNIX SEMICONDUCTOR INC
2 patentsUS7616415B2Nov 10, 2009
Electrostatic discharge protection circuit and electrostatic discharge protection method of a semiconductor memory device
HYNIX SEMICONDUCTOR INC4 citations60
US7876541B2Jan 25, 2011
Electrostatic discharge protection circuit and electrostatic discharge protection method of a semiconductor memory device
HYNIX SEMICONDUCTOR INC1 citations48