Inventor

HSIEH MIN-HSIN

TW2 patents

⚠️ This page may combine multiple inventors who share the name “HSIEH MIN-HSIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

1 patent

US9703919B2Jul 11, 2017

System and method of filtering actual defects from defect information for a wafer

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations68

TAIWAN SEMICONDUCTOR MFG

1 patent

US9057965B2Jun 16, 2015

Method of generating a set of defect candidates for wafer

TAIWAN SEMICONDUCTOR MFG2 citations57