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Inventor
HIGGINS EDWARD P
US
2 patents
⚠️ This page may combine multiple inventors who share the name “HIGGINS EDWARD P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
1 patent
US7864502B2
Jan 4, 2011
In situ monitoring of wafer charge distribution in plasma processing
IBM
17 citations
76
BARKER BRIAN C
1 patent
US8634949B2
Jan 21, 2014
Manufacturing management using tool operating data
BARKER BRIAN C
8 citations
75