Inventor
UNG RATH
US5 patents
Patents
5 patentsUS7299388B2Nov 20, 2007
Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer
INFINEON TECHNOLOGIES AG7 citations72
US7539911B2May 26, 2009
Test mode for programming rate and precharge time for DRAM activate-precharge cycle
INFINEON TECHNOLOGIES AG3 citations61
US7457177B2Nov 25, 2008
Random access memory including circuit to compress comparison results
INFINEON TECHNOLOGIES AG5 citations60
US7362632B2Apr 22, 2008
Test parallelism increase by tester controllable switching of chip select groups
INFINEON TECHNOLOGIES AG2 citations60
US7313033B2Dec 25, 2007
Random access memory including first and second voltage sources
INFINEON TECHNOLOGIES AG4 citations60