Inventor
COHEN YEHUDA
IL20 patents
⚠️ This page may combine multiple inventors who share the name “COHEN YEHUDA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
9 patentsUS9070180B2Jun 30, 2015
Method, system, and computer program product for detection of defects based on multiple references
APPLIED MATERIALS ISRAEL LTD6 citations83
US9070014B2Jun 30, 2015
System, method and computer program product for defect detection based on multiple references
APPLIED MATERIALS ISRAEL LTD3 citations61
US12361526B2Jul 15, 2025
Reconstruction of a distorted image of an array of structural elements of a specimen
APPLIED MATERIALS ISRAEL LTD0 citations60
US12277750B2Apr 15, 2025
Identification of an array in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations60
US11798138B2Oct 24, 2023
Reconstruction of a distorted image of an array of structural elements of a specimen
APPLIED MATERIALS ISRAEL LTD0 citations60
US11645831B2May 9, 2023
Identification of an array in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations60
US7990546B2Aug 2, 2011
High throughput across-wafer-variation mapping
APPLIED MATERIALS ISRAEL LTD6 citations60
US9767356B2Sep 19, 2017
System, method and computer program product for defect detection based on multiple references
APPLIED MATERIALS ISRAEL LTD0 citations47
US9558548B2Jan 31, 2017
Method, system, and computer program product for detection of defects based on multiple references
APPLIED MATERIALS ISRAEL LTD0 citations47