Inventor
OIDE AKIRA
JP3 patents
Patents
3 patentsUS10145735B2Dec 4, 2018
Electromagnetic wave measuring device, electromagnetic wave measuring method, and programs therefor
TOPCON CORP0 citations46
US10802145B2Oct 13, 2020
Measuring device, measuring method, and programs therefor
TOPCON CORP0 citations36
US10240976B2Mar 26, 2019
Measuring device, measuring method, and programs therefor
TOPCON CORP0 citations36