Inventor · disambiguated record
Nobuaki Tamura
Also filed as: TAMURA NOBUAKI
3 granted patents·99 citations·filing 1981–1997
75Inventor score
Files withJEOL LTD1
Top patents by PatentIndex Score
3 records- 0189US4442355ADevice for detecting secondary electrons in a scanning electron microscopeJEOL LTD·Filed 1981·Granted Apr 10, 1984·42 cites·6 claims
- 0283US5920480AMethod and apparatus for detecting pallet full load state in sheet metal machining line and method and apparatus for controlling sheet metal machining line and work identifying apparatusFiled 1997·Granted Jul 6, 1999·31 cites·24 claims
- 0357US5880965AMethod of controlling a sheet metal machining line and apparatus for controlling the sameFiled 1996·Granted Mar 9, 1999·26 cites·21 claims
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