Inventor
COPPERHALL ANDREW J
US3 patents
Patents
3 patentsUS9892802B1Feb 13, 2018
Hardware assisted scheme for testing memories using scan
APPLE INC3 citations68
US10891884B1Jan 12, 2021
Test-response comparison circuit and scan data transfer scheme in a DFT architecture for micro LED based display panels
APPLE INC3 citations67
US9519026B2Dec 13, 2016
Compressed scan testing techniques
APPLE INC2 citations58