Inventor

HIWADA KIYOYASU

JP17 patents

⚠️ This page may combine multiple inventors who share the name “HIWADA KIYOYASU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HIWADA KIYOYASU

HEWLETT PACKARD CO

Apparatus and method for testing electronic devices

Electrical connection structure

High speed data train generating system with no restriction on length of generated data train

Method and apparatus for generating test waveforms to be applied to a device under test

Test head with improved shielding

Test head with improved shielding

Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal

NIHON MICRONICS KK

Secondary battery

Secondary battery-mounted circuit chip and manufacturing method thereof

Charging/discharging device

Secondary battery

Single layer secondary battery having a folded structure

DEWA HARUTADA

Semiconductor probe, testing device and testing method for testing quantum battery

Testing device and testing method for quantum battery using semiconductor probe

Evaluation apparatus and evaluation method of sheet type cell

KUDOH Takuo

Electrode structure of solid type secondary battery

HIWADA KIYOYASU

Repair apparatus of sheet type cell