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Inventor
RAVIKUMAR CHENNAGIRI P
IN
2 patents
Patents
2 patents
US7640475B2
Dec 29, 2009
At-speed transition fault testing with low speed scan enable
TEXAS INSTRUMENTS INC
5 citations
57
US7949920B2
May 24, 2011
DFT techniques to reduce test time and power for SoCs
TEXAS INSTRUMENTS INC
6 citations
50