Inventor
TERNULLO JR LUIGI
US28 patents
⚠️ This page may combine multiple inventors who share the name “TERNULLO JR LUIGI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
15 patentsUS5796745AAug 18, 1998
Memory array built-in self test circuit for testing multi-port memory arrays
IBM105 citations97
US5553082ASep 3, 1996
Built-in self-test for logic circuitry at memory array output
IBM115 citations96
US5535164AJul 9, 1996
BIST tester for multiple memories
IBM149 citations96
US5670812ASep 23, 1997
Field effect transistor having contact layer of transistor gate electrode material
IBM42 citations95
US5996097ANov 30, 1999
Testing logic associated with numerous memory cells in the word or bit dimension in parallel
IBM31 citations92
US5954830ASep 21, 1999
Method and apparatus for achieving higher performance data compression in ABIST testing by reducing the number of data outputs
IBM39 citations92
US5790564AAug 4, 1998
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
IBM25 citations92
US5757050AMay 26, 1998
Field effect transistor having contact layer of transistor gate electrode material
IBM18 citations92
US5744384AApr 28, 1998
Semiconductor structures which incorporate thin film transistors
IBM21 citations92
US5563833AOct 8, 1996
Using one memory to supply addresses to an associated memory during testing
IBM23 citations92
US5771242AJun 23, 1998
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
IBM12 citations73
US5761213AJun 2, 1998
Method and apparatus to determine erroneous value in memory cells using data compression
IBM11 citations73
US5745498AApr 28, 1998
Rapid compare of two binary numbers
IBM8 citations73
US5539753AJul 23, 1996
Method and apparatus for output deselecting of data during test
IBM15 citations69
US6353903B1Mar 5, 2002
Method and apparatus for testing differential signals
IBM6 citations62
VANGUARD INT SEMICONDUCT CORP
12 patentsUS6061296AMay 9, 2000
Multiple data clock activation with programmable delay for use in multiple CAS latency memory devices
VANGUARD INT SEMICONDUCT CORP280 citations98
US6111447AAug 29, 2000
Timing circuit that selectively triggers on a rising or falling input signal edge
VANGUARD INT SEMICONDUCT CORP58 citations96
US6246619B1Jun 12, 2001
Self-refresh test time reduction scheme
VANGUARD INT SEMICONDUCT CORP57 citations93
US6208197B1Mar 27, 2001
Internal charge pump voltage limit control
VANGUARD INT SEMICONDUCT CORP29 citations93
US6052328AApr 18, 2000
High-speed synchronous write control scheme
VANGUARD INT SEMICONDUCT CORP24 citations93
US6016072AJan 18, 2000
Regulator system for an on-chip supply voltage generator
VANGUARD INT SEMICONDUCT CORP26 citations89
US6327215B1Dec 4, 2001
Local bit switch decode circuit and method
VANGUARD INT SEMICONDUCT CORP10 citations74
US6060873AMay 9, 2000
On-chip-generated supply voltage regulator with power-up mode
VANGUARD INT SEMICONDUCT CORP11 citations74
US5973895AOct 26, 1999
Method and circuit for disabling a two-phase charge pump
VANGUARD INT SEMICONDUCT CORP7 citations73
US7102421B1Sep 5, 2006
Dynamically adjustable on-chip supply voltage generation
VANGUARD INT SEMICONDUCT CORP5 citations63
US6133748AOct 17, 2000
Crow-bar current reduction circuit
VANGUARD INT SEMICONDUCT CORP4 citations63
US5796665AAug 18, 1998
Semiconductor memory device with improved read signal generation of data lines and assisted precharge to mid-level
VANGUARD INT SEMICONDUCT CORP5 citations63