P

Inventor

TERNULLO JR LUIGI

US28 patents
⚠️ This page may combine multiple inventors who share the name “TERNULLO JR LUIGI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

15 patents
US5796745AAug 18, 1998

Memory array built-in self test circuit for testing multi-port memory arrays

IBM105 citations97
US5553082ASep 3, 1996

Built-in self-test for logic circuitry at memory array output

IBM115 citations96
US5535164AJul 9, 1996

BIST tester for multiple memories

IBM149 citations96
US5670812ASep 23, 1997

Field effect transistor having contact layer of transistor gate electrode material

IBM42 citations95
US5996097ANov 30, 1999

Testing logic associated with numerous memory cells in the word or bit dimension in parallel

IBM31 citations92
US5954830ASep 21, 1999

Method and apparatus for achieving higher performance data compression in ABIST testing by reducing the number of data outputs

IBM39 citations92
US5790564AAug 4, 1998

Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor

IBM25 citations92
US5757050AMay 26, 1998

Field effect transistor having contact layer of transistor gate electrode material

IBM18 citations92
US5744384AApr 28, 1998

Semiconductor structures which incorporate thin film transistors

IBM21 citations92
US5563833AOct 8, 1996

Using one memory to supply addresses to an associated memory during testing

IBM23 citations92
US5771242AJun 23, 1998

Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor

IBM12 citations73
US5761213AJun 2, 1998

Method and apparatus to determine erroneous value in memory cells using data compression

IBM11 citations73
US5745498AApr 28, 1998

Rapid compare of two binary numbers

IBM8 citations73
US5539753AJul 23, 1996

Method and apparatus for output deselecting of data during test

IBM15 citations69
US6353903B1Mar 5, 2002

Method and apparatus for testing differential signals

IBM6 citations62

VANGUARD INT SEMICONDUCT CORP

12 patents
US6061296AMay 9, 2000

Multiple data clock activation with programmable delay for use in multiple CAS latency memory devices

VANGUARD INT SEMICONDUCT CORP280 citations98
US6111447AAug 29, 2000

Timing circuit that selectively triggers on a rising or falling input signal edge

VANGUARD INT SEMICONDUCT CORP58 citations96
US6246619B1Jun 12, 2001

Self-refresh test time reduction scheme

VANGUARD INT SEMICONDUCT CORP57 citations93
US6208197B1Mar 27, 2001

Internal charge pump voltage limit control

VANGUARD INT SEMICONDUCT CORP29 citations93
US6052328AApr 18, 2000

High-speed synchronous write control scheme

VANGUARD INT SEMICONDUCT CORP24 citations93
US6016072AJan 18, 2000

Regulator system for an on-chip supply voltage generator

VANGUARD INT SEMICONDUCT CORP26 citations89
US6327215B1Dec 4, 2001

Local bit switch decode circuit and method

VANGUARD INT SEMICONDUCT CORP10 citations74
US6060873AMay 9, 2000

On-chip-generated supply voltage regulator with power-up mode

VANGUARD INT SEMICONDUCT CORP11 citations74
US5973895AOct 26, 1999

Method and circuit for disabling a two-phase charge pump

VANGUARD INT SEMICONDUCT CORP7 citations73
US7102421B1Sep 5, 2006

Dynamically adjustable on-chip supply voltage generation

VANGUARD INT SEMICONDUCT CORP5 citations63
US6133748AOct 17, 2000

Crow-bar current reduction circuit

VANGUARD INT SEMICONDUCT CORP4 citations63
US5796665AAug 18, 1998

Semiconductor memory device with improved read signal generation of data lines and assisted precharge to mid-level

VANGUARD INT SEMICONDUCT CORP5 citations63

PALOMAR TECHN CORP

1 patent