Inventor

SIMOVITCH YARIV

IL3 patents

Patents

3 patents

US11803961B2Oct 31, 2023

Die-to-multi-die wafer inspection

APPLIED MATERIALS ISRAEL LTD0 citations56

US11644426B2May 9, 2023

Methods and systems for generating calibration data for wafer analysis

APPLIED MATERIALS ISRAEL LTD0 citations49

US11029253B2Jun 8, 2021

Computerized method for configuring an inspection system, computer program product and an inspection system

APPLIED MATERIALS ISRAEL LTD0 citations46