Inventor
HONG QI-ZHONG
US47 patents
⚠️ This page may combine multiple inventors who share the name “HONG QI-ZHONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
44 patentsUS6461955B1Oct 8, 2002
Yield improvement of dual damascene fabrication through oxide filling
TEXAS INSTRUMENTS INC54 citations96
US6355559B1Mar 12, 2002
Passivation of inlaid metallization
TEXAS INSTRUMENTS INC73 citations96
US6143645ANov 7, 2000
Reduced temperature contact/via filling
TEXAS INSTRUMENTS INC77 citations96
US6077774AJun 20, 2000
Method of forming ultra-thin and conformal diffusion barriers encapsulating copper
TEXAS INSTRUMENTS INC82 citations96
US6008117ADec 28, 1999
Method of forming diffusion barriers encapsulating copper
TEXAS INSTRUMENTS INC78 citations96
US5892282AApr 6, 1999
Barrier-less plug structure
TEXAS INSTRUMENTS INC46 citations96
US6358849B1Mar 19, 2002
Integrated circuit interconnect and method
TEXAS INSTRUMENTS INC66 citations95
US6372566B1Apr 16, 2002
Method of forming a silicide layer using metallic impurities and pre-amorphization
TEXAS INSTRUMENTS INC25 citations93
US6323553B1Nov 27, 2001
Reduced temperature contact/via filling
TEXAS INSTRUMENTS INC25 citations93
US6245672B1Jun 12, 2001
Method of forming diffusion barriers for copper metallization in integrated cirucits
TEXAS INSTRUMENTS INC20 citations93
US6150252ANov 21, 2000
Multi-stage semiconductor cavity filling process
TEXAS INSTRUMENTS INC38 citations93
US6120842ASep 19, 2000
TiN+Al films and processes
TEXAS INSTRUMENTS INC22 citations93
US6077782AJun 20, 2000
Method to improve the texture of aluminum metallization
TEXAS INSTRUMENTS INC25 citations93
US6054382AApr 25, 2000
Method of improving texture of metal films in semiconductor integrated circuits
TEXAS INSTRUMENTS INC36 citations93
US5985763ANov 16, 1999
Method for producing barrier-less plug structures
TEXAS INSTRUMENTS INC26 citations93
US5668411ASep 16, 1997
Diffusion barrier trilayer for minimizing reaction between metallization layers of integrated circuits
TEXAS INSTRUMENTS INC43 citations93
US6046105AApr 4, 2000
Preferential lateral silicidation of gate with low source and drain silicon consumption
TEXAS INSTRUMENTS INC21 citations92
US9589093B2Mar 7, 2017
Multilevel via placement with improved yield in dual damascene interconnection
TEXAS INSTRUMENTS INC10 citations84
US6660650B1Dec 9, 2003
Selective aluminum plug formation and etchback process
TEXAS INSTRUMENTS INC15 citations84
US6329282B1Dec 11, 2001
Method of improving the texture of aluminum metallization for tungsten etch back processing
TEXAS INSTRUMENTS INC15 citations84
US6680249B2Jan 20, 2004
Si-rich surface layer capped diffusion barriers
TEXAS INSTRUMENTS INC14 citations83
US6114733ASep 5, 2000
Surface protective layer for improved silicide formation
TEXAS INSTRUMENTS INC9 citations74
US6048784AApr 11, 2000
Transistor having an improved salicided gate and method of construction
TEXAS INSTRUMENTS INC9 citations74
US6037013AMar 14, 2000
Barrier/liner with a SiNx-enriched surface layer on MOCVD prepared films
TEXAS INSTRUMENTS INC15 citations74
US5605724AFeb 25, 1997
Method of forming a metal conductor and diffusion layer
TEXAS INSTRUMENTS INC9 citations74
US10354951B1Jul 16, 2019
Thin film resistor with punch-through vias
TEXAS INSTRUMENTS INC2 citations72
US10784193B2Sep 22, 2020
IC with thin film resistor with metal walls
TEXAS INSTRUMENTS INC3 citations68
US7192863B2Mar 20, 2007
Method of eliminating etch ridges in a dual damascene process
TEXAS INSTRUMENTS INC9 citations66
US6835648B2Dec 28, 2004
Semiconductor PMD layer dielectric
TEXAS INSTRUMENTS INC5 citations63
US6037254AMar 14, 2000
Method of making a surface protective layer for improved silicide formation
TEXAS INSTRUMENTS INC4 citations63
US11848268B2Dec 19, 2023
Thin film resistor with punch-through vias
TEXAS INSTRUMENTS INC0 citations62
US11101212B2Aug 24, 2021
Thin film resistor with punch-through vias
TEXAS INSTRUMENTS INC0 citations62
US6777300B2Aug 17, 2004
Method to improve silicide formation on polysilicon
TEXAS INSTRUMENTS INC4 citations62
US6544886B2Apr 8, 2003
Process for isolating an exposed conducting surface
TEXAS INSTRUMENTS INC6 citations60
US6046113AApr 4, 2000
Combined dry and wet etch for improved silicide formation
TEXAS INSTRUMENTS INC5 citations60
US11424183B2Aug 23, 2022
IC with thin film resistor with metal walls
TEXAS INSTRUMENTS INC0 citations58
US6677232B2Jan 13, 2004
Method for fabricating metal conductors and multi-level interconnects in a semiconductor device
TEXAS INSTRUMENTS INC2 citations57
US12406880B2Sep 2, 2025
Dielectric silicon nitride barrier deposition process for improved metal leakage and adhesion
TEXAS INSTRUMENTS INC0 citations56
US10242147B2Mar 26, 2019
Multilevel via placement with improved yield in dual damascene interconnection
TEXAS INSTRUMENTS INC0 citations52
US6903000B2Jun 7, 2005
System for improving thermal stability of copper damascene structure
TEXAS INSTRUMENTS INC1 citations50
US10361095B2Jul 23, 2019
Metal interconnect processing for an integrated circuit metal stack
TEXAS INSTRUMENTS INC0 citations49
US10002774B1Jun 19, 2018
Metal interconnect processing for a non-reactive metal stack
TEXAS INSTRUMENTS INC1 citations49
US10439020B2Oct 8, 2019
In-situ plasma treatment for thin film resistors
TEXAS INSTRUMENTS INC0 citations41
US10211278B2Feb 19, 2019
Device and method for a thin film resistor using a via retardation layer
TEXAS INSTRUMENTS INC0 citations41
IBM
3 patentsUS5624869AApr 29, 1997
Method of forming a film for a multilayer Semiconductor device for improving thermal stability of cobalt silicide using platinum or nitrogen
IBM70 citations96
US5834374ANov 10, 1998
Method for controlling tensile and compressive stresses and mechanical problems in thin films on substrates
IBM30 citations89
US5945737AAug 31, 1999
Thin film or solder ball including a metal and an oxide, nitride, or carbide precipitate of an expandable or contractible element
IBM5 citations72