P

Inventor

HONG QI-ZHONG

US47 patents
⚠️ This page may combine multiple inventors who share the name “HONG QI-ZHONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

44 patents
US6461955B1Oct 8, 2002

Yield improvement of dual damascene fabrication through oxide filling

TEXAS INSTRUMENTS INC54 citations96
US6355559B1Mar 12, 2002

Passivation of inlaid metallization

TEXAS INSTRUMENTS INC73 citations96
US6143645ANov 7, 2000

Reduced temperature contact/via filling

TEXAS INSTRUMENTS INC77 citations96
US6077774AJun 20, 2000

Method of forming ultra-thin and conformal diffusion barriers encapsulating copper

TEXAS INSTRUMENTS INC82 citations96
US6008117ADec 28, 1999

Method of forming diffusion barriers encapsulating copper

TEXAS INSTRUMENTS INC78 citations96
US5892282AApr 6, 1999

Barrier-less plug structure

TEXAS INSTRUMENTS INC46 citations96
US6358849B1Mar 19, 2002

Integrated circuit interconnect and method

TEXAS INSTRUMENTS INC66 citations95
US6372566B1Apr 16, 2002

Method of forming a silicide layer using metallic impurities and pre-amorphization

TEXAS INSTRUMENTS INC25 citations93
US6323553B1Nov 27, 2001

Reduced temperature contact/via filling

TEXAS INSTRUMENTS INC25 citations93
US6245672B1Jun 12, 2001

Method of forming diffusion barriers for copper metallization in integrated cirucits

TEXAS INSTRUMENTS INC20 citations93
US6150252ANov 21, 2000

Multi-stage semiconductor cavity filling process

TEXAS INSTRUMENTS INC38 citations93
US6120842ASep 19, 2000

TiN+Al films and processes

TEXAS INSTRUMENTS INC22 citations93
US6077782AJun 20, 2000

Method to improve the texture of aluminum metallization

TEXAS INSTRUMENTS INC25 citations93
US6054382AApr 25, 2000

Method of improving texture of metal films in semiconductor integrated circuits

TEXAS INSTRUMENTS INC36 citations93
US5985763ANov 16, 1999

Method for producing barrier-less plug structures

TEXAS INSTRUMENTS INC26 citations93
US5668411ASep 16, 1997

Diffusion barrier trilayer for minimizing reaction between metallization layers of integrated circuits

TEXAS INSTRUMENTS INC43 citations93
US6046105AApr 4, 2000

Preferential lateral silicidation of gate with low source and drain silicon consumption

TEXAS INSTRUMENTS INC21 citations92
US9589093B2Mar 7, 2017

Multilevel via placement with improved yield in dual damascene interconnection

TEXAS INSTRUMENTS INC10 citations84
US6660650B1Dec 9, 2003

Selective aluminum plug formation and etchback process

TEXAS INSTRUMENTS INC15 citations84
US6329282B1Dec 11, 2001

Method of improving the texture of aluminum metallization for tungsten etch back processing

TEXAS INSTRUMENTS INC15 citations84
US6680249B2Jan 20, 2004

Si-rich surface layer capped diffusion barriers

TEXAS INSTRUMENTS INC14 citations83
US6114733ASep 5, 2000

Surface protective layer for improved silicide formation

TEXAS INSTRUMENTS INC9 citations74
US6048784AApr 11, 2000

Transistor having an improved salicided gate and method of construction

TEXAS INSTRUMENTS INC9 citations74
US6037013AMar 14, 2000

Barrier/liner with a SiNx-enriched surface layer on MOCVD prepared films

TEXAS INSTRUMENTS INC15 citations74
US5605724AFeb 25, 1997

Method of forming a metal conductor and diffusion layer

TEXAS INSTRUMENTS INC9 citations74
US10354951B1Jul 16, 2019

Thin film resistor with punch-through vias

TEXAS INSTRUMENTS INC2 citations72
US10784193B2Sep 22, 2020

IC with thin film resistor with metal walls

TEXAS INSTRUMENTS INC3 citations68
US7192863B2Mar 20, 2007

Method of eliminating etch ridges in a dual damascene process

TEXAS INSTRUMENTS INC9 citations66
US6835648B2Dec 28, 2004

Semiconductor PMD layer dielectric

TEXAS INSTRUMENTS INC5 citations63
US6037254AMar 14, 2000

Method of making a surface protective layer for improved silicide formation

TEXAS INSTRUMENTS INC4 citations63
US11848268B2Dec 19, 2023

Thin film resistor with punch-through vias

TEXAS INSTRUMENTS INC0 citations62
US11101212B2Aug 24, 2021

Thin film resistor with punch-through vias

TEXAS INSTRUMENTS INC0 citations62
US6777300B2Aug 17, 2004

Method to improve silicide formation on polysilicon

TEXAS INSTRUMENTS INC4 citations62
US6544886B2Apr 8, 2003

Process for isolating an exposed conducting surface

TEXAS INSTRUMENTS INC6 citations60
US6046113AApr 4, 2000

Combined dry and wet etch for improved silicide formation

TEXAS INSTRUMENTS INC5 citations60
US11424183B2Aug 23, 2022

IC with thin film resistor with metal walls

TEXAS INSTRUMENTS INC0 citations58
US6677232B2Jan 13, 2004

Method for fabricating metal conductors and multi-level interconnects in a semiconductor device

TEXAS INSTRUMENTS INC2 citations57
US12406880B2Sep 2, 2025

Dielectric silicon nitride barrier deposition process for improved metal leakage and adhesion

TEXAS INSTRUMENTS INC0 citations56
US10242147B2Mar 26, 2019

Multilevel via placement with improved yield in dual damascene interconnection

TEXAS INSTRUMENTS INC0 citations52
US6903000B2Jun 7, 2005

System for improving thermal stability of copper damascene structure

TEXAS INSTRUMENTS INC1 citations50
US10361095B2Jul 23, 2019

Metal interconnect processing for an integrated circuit metal stack

TEXAS INSTRUMENTS INC0 citations49
US10002774B1Jun 19, 2018

Metal interconnect processing for a non-reactive metal stack

TEXAS INSTRUMENTS INC1 citations49
US10439020B2Oct 8, 2019

In-situ plasma treatment for thin film resistors

TEXAS INSTRUMENTS INC0 citations41
US10211278B2Feb 19, 2019

Device and method for a thin film resistor using a via retardation layer

TEXAS INSTRUMENTS INC0 citations41

IBM

3 patents