Inventor
SHAIK TANVEER
US2 patents
Patents
2 patentsUS12023722B2Jul 2, 2024
Stamping line defect quality monitoring systems and methods of monitoring stamping line defects
FORD GLOBAL TECH LLC0 citations46
US12499665B2Dec 16, 2025
Method and system to augment images and labels to be compatible with various machine learning models
FORD GLOBAL TECH LLC0 citations41